Wavelength and intensity monitoring of optical cavity

• US 7,852,486 B2
• Filed: 02/07/2008
• Issued: 12/14/2010
• Est. Priority Date: 02/07/2008
• Status: Expired due to Fees

• Current Assignee: Board of Regents of the University of Texas System (University of Texas System)
• Original Assignee: Board of Regents of the University of Texas System (University of Texas System)
• Inventors: Stelmakh, Nikolai Michael, Vasilyev, Michael
• Primary Examiner(s): Harvey; Minsun
• Assistant Examiner(s): CARTER, MICHAEL W
• Application Number:
  US12/027,973
• Publication Number:
  US 20090201959A1
• Time in Patent Office: 1,041 Days
• Field of Search: 356/484, 356/450, 372/50.21
• US Class Current: 356/484
• CPC Class Codes: B82Y 20/00 Nanooptics, e.g. quantum optics or photonic crystals
• CPC Class Codes: G02B 6/1225 comprising photonic band-gap structures or photonic lattices
• CPC Class Codes: H01S 5/0014 Measuring characteristics or properties thereof measuring techniques per se G01J, G01K, G01N, G01R
• CPC Class Codes: H01S 5/2036 Broad area lasers

Abstract

According to various illustrative embodiments, a device, method, and system for measuring optical fine structure of lateral modes of an optical cavity are described. In one aspect, the device comprises at least one photodetector arranged to detect an output of the optical cavity in a lateral direction thereof. The device also comprises an analyzer coupled to an output of the at least one photodetector and arranged to analyze at least a portion of signals produced in the at least one photodetector by at least a portion of the lateral modes of the optical cavity. The device also comprises a processor arranged to determine the optical fine structure of the at least the portion of the lateral modes of the optical cavity based on an output of the analyzer.

Claims

1. A device for measuring optical fine structure of lateral modes of an optical cavity, the device comprising:

at least one photodetector arranged to detect an output of the optical cavity in a lateral direction thereof;

an analyzer coupled to an output of the at least one photodetector and arranged to analyze at least a portion of signals produced in the at least one photodetector by at least a portion of the lateral modes of the optical cavity; and

a processor arranged to determine the optical fine structure of the at least the portion of the lateral modes of the optical cavity based on an output of the analyzer.

2. The device of claim 1, wherein the analyzer comprises a radio frequency spectrum analyzer.

3. The device of claim 2, wherein the signals comprise radio frequency beat frequencies.

4. The device of claim 1, wherein the analyzer comprises an oscilloscope.

5. The device of claim 4, wherein the signals comprise time-domain signals corresponding to radio frequency beat frequencies.

6. The device of claim 1, wherein the optical cavity is disposed in a diode.

7. The device of claim 6, wherein the optical cavity is disposed in a broad-area laser diode or a light-emitting diode.

8. The device of claim 1, wherein the at least one photodetector comprises an array of photodiodes.

9. The device of claim 1, wherein the at least one photodetector comprises an array of photodiodes disposed in a near-field domain of the optical cavity.

10. The device of claim 1, wherein the at least one photodetector comprises an array of photodiodes disposed in a far-field domain of the optical cavity.

11. The device of claim 1, wherein the at least one photodetector comprises an array of photodiodes arranged to detect the output of the optical cavity in the lateral direction thereof by radio frequency switching of the array of the photodiodes.

12. The device of claim 1, wherein the at least one photodetector comprises an array of photodiodes arranged to detect the output of the optical cavity in the lateral direction thereof by self-heterodyning the array of the photodiodes.

13. The device of claim 1, wherein the at least one photodetector is arranged to detect the output of the optical cavity in the lateral direction thereof by using an array of movable mirrors.

14. The device of claim 1, wherein the processor is arranged to determine the optical fine structure comprising at least one of wavelength position and lateral mode intensity of the at least the portion of the lateral modes of the optical cavity.

15. A method for measuring optical fine structure of lateral modes of an optical cavity, the method comprising:

detecting an output of the optical cavity in a lateral direction thereof using at least one photodetector;

analyzing at least a portion of signals produced in the at least one photodetector by at least a portion of the lateral modes of the optical cavity using an analyzer coupled to an output of the at least one photodetector; and

determining the optical fine structure of the at least the portion of the lateral modes of the optical cavity based on an output of the analyzer using a processor.

16. The method of claim 15, wherein the analyzer comprises a radio frequency spectrum analyzer.

17. The method of claim 16, wherein the signals comprise radio frequency beat frequencies.

18. The method of claim 15, wherein the analyzer comprises an oscilloscope.

19. The method of claim 18, wherein the signals comprise time-domain signals corresponding to radio frequency beat frequencies.

20. The method of claim 15, wherein the optical cavity is disposed in one of a broad-area laser diode or a light-emitting diode.

21. The method of claim 15, wherein using the at least one photodetector further comprises using an array of photodiodes.

22. The method of claim 15, wherein using the at least one photodetector further comprises using an array of photodiodes disposed in a near-field domain of the optical cavity.

23. The method of claim 15, wherein using the at least one photodetector further comprises using an array of photodiodes disposed in a far-field domain of the optical cavity.

24. The method of claim 15, wherein using the at least one photodetector further comprises using an array of photodiodes and detecting the output of the optical cavity in the lateral direction thereof further comprises radio frequency switching of the array of the photodiodes.

25. The method of claim 15, wherein using the at least one photodetector further comprises using an array of photodiodes and detecting the output of the optical cavity in the lateral direction thereof further comprises self-heterodyning the array of the photodiodes.

26. The method of claim 15, wherein using the at least one photodetector further comprises using an array of movable mirrors.

27. The method of claim 15, wherein determining the optical fine structure of the at least the portion of the lateral modes of the optical cavity further comprises determining at least one of wavelength position and lateral mode intensity of the at least the portion of the lateral modes of the optical cavity.

28. A system for measuring optical fine structure of lateral modes of an optical cavity, the system comprising:

at least one photodetector on the optical cavity at an end portion thereof, the at least one photodetector arranged to detect an output of the optical cavity in a lateral direction thereof using a first radio frequency switch;

a radio frequency spectrum analyzer coupled to an output of the at least one photodetector and arranged to analyze at least a portion of radio frequency beat frequencies produced in the at least one photodetector by at least a portion of the lateral modes of the optical cavity; and

a processor arranged to determine the optical fine structure of the at least the portion of the lateral modes of the optical cavity based on an output of the radio frequency spectrum analyzer and to provide mode-stabilization retroactive feedback to the at least one photodetector using a second radio frequency switch.

29. The system of claim 28, wherein the at least one photodetector comprises an array of isolated contacts comprising saturable absorbers laterally disposed on the optical cavity at an end portion thereof.