Chip structure with bumps and testing pads
First Claim
1. A chip comprising:
- a silicon substrate;
multiple MOS devices in or on said silicon substrate;
a first dielectric layer over said silicon substrate;
a metallization structure over said first dielectric layer, wherein said metallization structure comprises a first circuit layer and a second circuit layer over said first circuit layer, wherein said metallization structure comprises electroplated copper;
a second dielectric layer between said first and second circuit layers;
a passivation layer over said metallization structure and over said first and second dielectric layers, wherein a first opening in said passivation layer is over a first contact point of said metallization structure, and said first contact point is at a bottom of said first opening, wherein said passivation layer has a thickness greater than 0.35 micrometers, wherein said passivation layer comprises a nitride layer;
a first metal layer over said passivation layer and on said first contact point, wherein said first metal layer has a thickness greater than 0.6 micrometers, wherein said first metal layer comprises a first titanium-containing layer and a first copper layer over said first titanium-containing layer;
a first polymer layer over said passivation layer and over said first metal layer, wherein a second opening in said first polymer layer is over a second contact point of said first metal layer, wherein said second contact point is connected to said first contact point through said first opening; and
a second metal layer on said first polymer layer and on said second contact point, wherein said second metal layer is connected to said second contact point through said second opening, wherein said second metal layer has a thickness greater than 0.6 micrometers, wherein said second metal layer comprises a second titanium-containing layer, a second copper layer over said second titanium-containing layer, a nickel-containing layer on said second copper layer, and a gold-containing layer on said nickel-containing layer.
4 Assignments
0 Petitions
Accused Products
Abstract
A chip structure comprising a semiconductor substrate, a plurality of dielectric layers, a plurality of circuit layers, a passivation layer, a metal layer and at least a bump. The semiconductor substrate has a plurality of electronic devices positioned on a surface layer of the semiconductor substrate. The dielectric layers are sequentially stacked on the semiconductor substrate and have a plurality of via holes. The circuit layers are disposed on one of the dielectric layers, wherein the circuit layers are electrically connected with each other through the via holes and are electrically connected to the electronic devices. The passivation layer is disposed over the circuit layers and the dielectric layers, wherein the passivation layer comprises an opening that exposes one of the metal layers. The metal layer is disposed over the passivation layer, wherein the metal layer comprises at least a bump pad and at least a testing pad, the bump pad electrically connecting with the testing pad. The bump is disposed on the bump pad.
207 Citations
37 Claims
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1. A chip comprising:
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a silicon substrate; multiple MOS devices in or on said silicon substrate; a first dielectric layer over said silicon substrate; a metallization structure over said first dielectric layer, wherein said metallization structure comprises a first circuit layer and a second circuit layer over said first circuit layer, wherein said metallization structure comprises electroplated copper; a second dielectric layer between said first and second circuit layers; a passivation layer over said metallization structure and over said first and second dielectric layers, wherein a first opening in said passivation layer is over a first contact point of said metallization structure, and said first contact point is at a bottom of said first opening, wherein said passivation layer has a thickness greater than 0.35 micrometers, wherein said passivation layer comprises a nitride layer; a first metal layer over said passivation layer and on said first contact point, wherein said first metal layer has a thickness greater than 0.6 micrometers, wherein said first metal layer comprises a first titanium-containing layer and a first copper layer over said first titanium-containing layer; a first polymer layer over said passivation layer and over said first metal layer, wherein a second opening in said first polymer layer is over a second contact point of said first metal layer, wherein said second contact point is connected to said first contact point through said first opening; and a second metal layer on said first polymer layer and on said second contact point, wherein said second metal layer is connected to said second contact point through said second opening, wherein said second metal layer has a thickness greater than 0.6 micrometers, wherein said second metal layer comprises a second titanium-containing layer, a second copper layer over said second titanium-containing layer, a nickel-containing layer on said second copper layer, and a gold-containing layer on said nickel-containing layer. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A chip comprising:
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a silicon substrate; multiple MOS devices in or on said silicon substrate; a first dielectric layer over said silicon substrate; a metallization structure over said first dielectric layer, wherein said metallization structure comprises a first circuit layer and a second circuit layer over said first circuit layer, wherein said metallization structure comprises electroplated copper; a second dielectric layer between said first and second circuit layers; a passivation layer over said metallization structure and over said first and second dielectric layers, wherein a first opening in said passivation layer is over a first contact point of said metallization structure, and said first contact point is at a bottom of said first opening, wherein said first contact point has an area vertically over a portion of said multiple MOS devices, wherein said passivation layer has a thickness greater than 0.35 micrometers, wherein said passivation layer comprises a nitride layer; a first metal layer over said passivation layer and on said first contact point, wherein said first metal layer has a thickness greater than 0.6 micrometers, wherein said first metal layer comprises a first titanium-containing layer and a first copper layer over said first titanium-containing layer; a first polymer layer over said passivation layer and over said first metal layer, wherein a second opening in said first polymer layer is over a second contact point of said first metal layer, wherein said second contact point is connected to said first contact point through said first opening; a second metal layer on said first polymer layer and on said second contact point, wherein said second metal layer is connected to said second contact point through said second opening, wherein said second metal layer has a thickness greater than 0.6 micrometers, wherein said second metal layer comprises a second titanium-containing layer, a second copper layer over said second titanium-containing layer, and a nickel-containing layer on said second copper layer, wherein said second metal layer comprises a portion vertically over said area of said first contact point and vertically over said portion of said multiple MOS devices; and a tin-containing solder over said second metal layer, wherein said tin-containing solder is connected to said first contact point through said first and second metal layers. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20)
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21. A chip comprising:
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a silicon substrate; multiple MOS devices in or on said silicon substrate; a first dielectric layer over said silicon substrate; a metallization structure over said first dielectric layer, wherein said metallization structure comprises a first circuit layer and a second circuit layer over said first circuit layer, wherein said metallization structure comprises electroplated copper; a second dielectric layer between said first and second circuit layers; a passivation layer over said metallization structure and over said first and second dielectric layers, wherein a first opening in said passivation layer is over a first contact point of said metallization structure, and said first contact point is at a bottom of said first opening, wherein said passivation layer has a thickness greater than 0.35 micrometers, wherein said passivation layer comprises a nitride layer; a first metal layer directly on said passivation layer and on said first contact point, wherein there is no polymer layer between said first metal layer and said passivation layer, wherein said first metal layer has a thickness greater than 0.6 micrometers, wherein said first metal layer comprises a first titanium-containing layer and a first copper layer over said first titanium-containing layer; a first polymer layer over said first metal layer, wherein a second opening in said first polymer layer is over a second contact point of said first metal layer, wherein said second contact point is connected to said first contact point through said first opening; a second metal layer on said first polymer layer and on said second contact point, wherein said second metal layer is connected to said second contact point through said second opening, wherein said second metal layer has a thickness greater than 0.6 micrometers, wherein said second metal layer comprises a second titanium-containing layer and a second copper layer over said second titanium-containing layer; and a tin-containing solder over said second metal layer and vertically over an area of said first contact point, wherein said tin-containing solder is connected to said first contact point through said first and second metal layers. - View Dependent Claims (22, 23, 24, 25, 26, 27)
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28. A chip comprising:
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a silicon substrate; multiple MOS devices in or on said silicon substrate; a first dielectric layer over said silicon substrate; a metallization structure over said first dielectric layer, wherein said metallization structure comprises a first circuit layer and a second circuit layer over said first circuit layer, wherein said metallization structure comprises electroplated copper; a second dielectric layer between said first and second circuit layers; a separating layer over said metallization structure and over said first and second dielectric layers, wherein a first opening in said separating layer is over a first contact point of said metallization structure, and said first contact point is at a bottom of said first opening; a first metal layer directly on said separating layer and on said first contact point, wherein there is no polymer layer between said separating layer and said first metal layer, wherein said first metal layer is connected to said first contact point through said first opening, wherein said first metal layer has a thickness greater than 0.6 micrometers, wherein said first metal layer comprises a first copper layer; a polymer layer over said first metal layer, over said separating layer and in a gap between two metal pieces of said first metal layer, wherein a second opening in said polymer layer is over a second contact point of said first metal layer, wherein said second contact point is connected to said first contact point through said first opening; a second metal layer on said polymer layer, on said second contact point and vertically over an area of said first contact point, wherein said second metal layer is connected to said second contact point through said second opening, wherein said second metal layer comprises a second copper layer; and a tin-containing solder over said second metal layer and vertically over said area of said first contact point, wherein said tin-containing solder is connected to said first contact point through said first and second metal layers. - View Dependent Claims (29, 30, 31, 32, 33)
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34. A circuit component comprising:
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a silicon substrate; multiple MOS devices in or on said silicon substrate; a first dielectric layer over said silicon substrate; a metallization structure over said first dielectric layer, wherein said metallization structure comprises a first circuit layer and a second circuit layer over said first circuit layer, wherein said metallization structure comprises electroplated copper; a second dielectric layer between said first and second circuit layers; a metal interconnect over said metallization structure; a passivation layer over said metallization structure, over said first and second dielectric layers and over said metal interconnect, wherein a first opening in said passivation layer is over a first contact point of said metal interconnect, and said first contact point is at a bottom of said first opening, and wherein a second opening in said passivation layer is over a second contact point of said metal interconnect, and said second contact point is at a bottom of said second opening, wherein said passivation layer has a thickness greater than 0.35 micrometers, wherein said passivation layer comprises a nitride layer; a metal layer over said passivation layer and on said first contact point, wherein said metal layer comprises a titanium-containing layer, a copper layer over said titanium-containing layer and a nickel layer on said copper layer, wherein said metal layer is connected to said first contact point through said first opening; a solder layer over said metal layer, wherein said solder layer comprises a lead-free alloy, wherein said solder layer is connected to said first contact point through said metal layer; and a wirebonded wire connected to said second contact point through said second opening, wherein said wirebonded wire is connected to said solder layer through said metal interconnect. - View Dependent Claims (35, 36, 37)
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Specification