System, method, and device including built-in self tests for communication bus device

• US 7,865,773 B2
• Filed: 08/27/2009
• Issued: 01/04/2011
• Est. Priority Date: 12/19/2006
• Status: Active Grant

• Current Assignee: Dell Products LP (Dell Technologies Inc.)
• Original Assignee: Dell Products LP (Dell Technologies Inc.)
• Inventors: Chaiken, Craig, O'Rourke, Andrew, Makhija, Vinod, Thornley, Bryan J.
• Primary Examiner(s): Iqbal; Nadeem
• Application Number:
  US12/549,221
• Publication Number:
  US 20090319828A1
• Time in Patent Office: 495 Days
• Field of Search: 714 25- 27, 714 30- 32, 714 37- 39, 714 43- 54, 714/56
• US Class Current: 714/30
• CPC Class Codes: G06F 11/27 Built-in tests

Abstract

A method, device, and system including built-in self tests for a communication bus device is disclosed. In one form, a method of testing a device operable to be coupled to a communication port an information handling system includes accessing a configuration descriptor of a first device operable to be coupled to a communication bus of an information handling system. The method can also include detecting a self-test descriptor associated with the configuration descriptor and testing a portion of the first device using test information associated with the self-test descriptor. The device and system can include logic to perform the methods described herein.

Claims

1. A device comprising:

a communication interface configured to be coupled to a communication bus of an information handling system;

a configuration descriptor stored within a memory operable to be accessed during a communication bus scan; and

a self-test descriptor associated with the configuration descriptor, the self-test descriptor configured to be read in association with the configuration descriptor, and configured to enable the information handling system to test a portion of the device using test information associated with the self-test descriptor.

2. The device of claim 1, further comprising a test mode operable to be activated in response to a detection of self-test descriptor.

3. The device of claim 2, wherein the test information is stored within the memory and operable to be used in association with the test mode.

4. The device of claim 3, wherein the test information includes a test name.

5. The device of claim 3, wherein the test information includes a test time-out value.

6. The device of claim 1, wherein the configuration descriptor includes the self-test descriptor.

7. A method of testing an electronic device, the method comprising:

accessing a configuration descriptor of a first device coupled to a communication bus of an information handling system;

detecting a self-test descriptor associated with the configuration descriptor;

parsing the self-test descriptor and the configuration descriptor; and

testing a portion of the first device using test information associated with the self-test descriptor after parsing the self-test descriptor and the configuration descriptor.

8. The method of claim 7, further comprising:

reading the test information from the configuration descriptor;

determining a test identifier within the test information; and

enabling a test mode to test the portion of the first device using the test identifier.

9. The method of claim 8, further comprising:

determining a time-out value associated with the test identifier; and

outputting an error message in response to exceeding a time-out value.

10. The method of claim 7, further comprising:

receiving a request to enable a test mode;

enabling the test mode;

determining when the testing a portion of the first device is complete; and

disabling the test mode.

11. The method of claim 7, further comprising:

reading the test information;

generating a test list based on reading the test information; and

using the test information within the test list to initiate the testing.

12. The method of claim 7, further comprising:

executing a system diagnostic process using the information handling system;

initiating the scanning of the communication bus scan using the system diagnostic process;

detecting the first device;

detecting a second device;

testing the first device using the test information;

testing the second device using a system diagnostic test; and

testing the first device using the system diagnostic test.

13. The method of claim 7, further comprising:

testing the first device using a first test identifier associated with a first test;

determining if the first device passed the first test;

determining a second test identifier associated with a second test;

testing the first device using the second test identifier; and

determining if the first device passed the second test.

14. The method of claim 7, further comprising:

determining when a test is not available for testing the first device;

disabling a test mode; and

enabling operating system commands in association with the first device.

15. An information handling system comprising:

a communication bus configured to couple the information handling system to a bus-enabled device;

a processor in communication with the communication bus, the processor configured to initiate a scan of the communication bus, to detect the bus-enabled device, to send a request to read a configuration descriptor of the bus-enabled device, to parse the configuration descriptor and a self-test descriptor associated with the configuration descriptor; and

a test mode output in communication with the communication bus, the test mode output configured to be coupled to the bus-enabled device in response to parsing the configuration descriptor and the self-test descriptor, and further configured to test a portion of the bus-enabled device using information associated with the self test descriptor.

16. The information handling system of claim 15, further comprising a diagnostic test system.

17. The information handling system of claim 16, wherein the processor is operable to build a test list using the test information, the test list including a test identifier.

18. The information handling system of claim 17, wherein the processor is further operable to activate a test using the test identifier provided within the test list.

19. The information handling system of claim 18, further comprising:

a display operably coupled to the processor to output the test list in association with a reference to the bus-enabled device; and

a selector operable to enable a user to select the test identifier displayed within the test list;

wherein the processor is further operable to initiate a testing of the bus-enabled device in response to a user selecting the test identifier.