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Successive approximate capacitance measurement circuit

  • US 7,884,621 B2
  • Filed: 11/07/2007
  • Issued: 02/08/2011
  • Est. Priority Date: 01/20/2006
  • Status: Expired due to Fees
First Claim
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1. A method of measuring a capacitance of a device under test (“

  • DUT”

    ) capacitor, comprising;

    generating a selectable current having a current magnitude, using a variable current source;

    switching between charging the DUT capacitor with the selectable current by driving the selectable current into the DUT capacitor and discharging the DUT capacitor at a switching frequency;

    comparing a first voltage, responsive to a second voltage on the DUT capacitor, to a reference voltage to determine whether the first voltage is greater than or less than the reference voltage; and

    adjusting at least one of the switching frequency, the current magnitude, or the reference voltage until the first voltage is substantially equal to the reference voltage;

    monitoring the first voltage while holding the switching frequency and current magnitude steady; and

    indicating when the first voltage crosses over the reference voltage.

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