Filler cells for design optimization in a place-and-route system

• US 7,895,548 B2
• Filed: 10/26/2007
• Issued: 02/22/2011
• Est. Priority Date: 10/26/2007
• Status: Active Grant

• Current Assignee: Synopsys Incorporated
• Original Assignee: Synopsys Incorporated
• Inventors: Lee, Jyh-Chwen Frank, Pramanik, Dipankar, Lin, Xi Wei
• Primary Examiner(s): WHITMORE, STACY
• Application Number:
  US11/924,738
• Publication Number:
  US 20090113368A1
• Time in Patent Office: 1,215 Days
• Field of Search: 716/10, 716/19
• US Class Current: 716/55
• CPC Class Codes: G06F 30/00 Computer-aided design [CAD]
• CPC Class Codes: G06F 30/39 Circuit design at the physical level physical level design for reconfigurable circuits G06F30/347
• CPC Class Codes: G06F 30/392 Floor-planning or layout, e.g. partitioning or placement
• CPC Class Codes: G06F 30/398 Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM] optical proximity correction [OPC] design processes G03F1/36
• CPC Class Codes: H01L 27/0207 Geometrical layout of the components, e.g. computer aided design; custom LSI, semi-custom LSI, standard cell technique

Abstract

A system and method are provided for laying out an integrated circuit design into a plurality of circuit layout cells having gaps therebetween, and inserting into each given one of at least a subset of the gaps, a corresponding filler cell selected from a predefined database in dependence upon a desired effect on a performance parameter of at least one circuit cell adjacent to the given gap. The circuit layout cells may be arranged in rows, and in some embodiments the selection of an appropriate filler cell for a given gap depends upon effects desired on a performance parameter of both circuit cells adjacent to the given gap. The predefined filler cells can include, for example, dummy diffusion regions, dummy poly lines, N-well boundary shifts and etch stop layer boundary shifts. In an embodiment, circuit layout cells can be moved in order to accommodate a selected filler cell.

Claims

1. A method for laying out an integrated circuit design, for use with a database defining a plurality of filler cell designs, the layout being for use in fabricating an integrated circuit device according to the design, comprising the steps of:

providing to a computer system a first layout of the integrated circuit design, the first layout defining a plurality of masks, the masks defining a plurality of integrated circuit features when applied in a fabrication process, the features defining a plurality of circuit layout cells having gaps therebetween; and

the computer system inserting into each given gap in at least a subset of the gaps, a corresponding filler cell selected from the database in dependence upon a desired effect on a performance parameter of at least one circuit cell adjacent to the given gap.

2. A method according to claim 1, wherein in the first layout, the plurality of circuit layout cells are arranged in rows, each of the gaps being disposed in one of the rows between a corresponding pair of the circuit cells in the same row,

and wherein the step of inserting a corresponding filler cell into each given gap, comprises the step of selecting the corresponding filler cell in dependence upon effects desired on a performance parameter of both circuit cells adjacent to the given gap.

3. A method according to claim 1, wherein the performance parameter is a member of the group consisting of transistor electron mobility, Ion, switching speed, signal path delay, leakage, and power.

4. A method according to claim 1, wherein the desired effect is to improve the performance parameter.

5. A method according to claim 1, wherein the desired effect is to reduce the sensitivity of the performance parameter to a circuit layout cell'"'"'s layout neighborhood.

6. A method according to claim 1, wherein the step of inserting a corresponding filler cell comprises the step of inserting a first filler cell in a gap adjacent to a subject circuit layout cell, the first filler cell including a dummy diffusion region longitudinally aligned with a diffusion region of an N-channel transistor in the subject circuit layout cell.

7. A method according to claim 1, wherein the fabricating of the integrated circuit device includes a step of applying an etch stop layer over gate stack layers of the integrated circuit device,

wherein the step of inserting a corresponding filler cell comprises the step of inserting a first filler cell in a gap adjacent to a subject circuit layout cell, the first filler cell including a transversely oriented dummy polysilicon line.

8. A method according to claim 1, wherein the step of inserting a corresponding filler cell comprises the step of inserting a first filler cell in a gap adjacent to a subject circuit layout cell, the first filler cell including a dummy contact region.

9. A method according to claim 1, wherein a subject circuit layout cell includes an N-well formed below P-channel transistors and not below N-channel transistors, the N-well having a longitudinally oriented well boundary,

and wherein the step of inserting a corresponding filler cell comprises the step of inserting a first filler cell in a gap adjacent to the subject circuit layout cell, the first filler cell including an N-well boundary, at least a portion of which being not in-line with the N-well boundary of the N-well in the subject circuit layout cell.

10. A method according to claim 1, wherein the fabricating of the integrated circuit device includes a step of applying an etch stop layer over gate stack layers of the integrated circuit device, the etch stop layer having a longitudinally oriented boundary,

and wherein the step of inserting a corresponding filler cell comprises the step of inserting a first filler cell in a gap adjacent to a subject circuit layout cell, the first filler cell including an etch stop layer boundary, at least a portion of which being not in-line with the etch stop layer boundary in the subject circuit layout cell.

11. A method according to claim 1, wherein the desired effect on a performance parameter includes improving transistor electron mobility in a CMOS circuit in a subject circuit layout cell,

and wherein the step of inserting a corresponding filler cell comprises the step of inserting a first filler cell in a gap adjacent to a subject circuit layout cell, the first filler cell including a dummy diffusion region longitudinally aligned with the diffusion region of an N-channel transistor in the subject circuit layout cell, the first filler cell lacking any diffusion region longitudinally aligned with the diffusion region of any P-channel transistor in the subject circuit layout cell.

12. A method according to claim 1, wherein the desired effect on the performance parameter derives at least in part from stress effects.

13. A method according to claim 1, wherein the desired effect on the performance parameter derives at least in part from optical proximity effects.

14. A method according to claim 1, wherein the desired effect on the performance parameter derives at least in part from the well proximity effect.

15. A method according to claim 1, further comprising the step of moving the position of a particular one of the circuit layout cells in order to make space for one of the corresponding filler cells.

16. A method according to claim 15, wherein the step of moving comprises the step of moving the position of the particular circuit layout cell in a manner that retains topological equivalence.

17. A method according to claim 15, wherein in the first layout, the plurality of circuit layout cells are arranged in rows,

and wherein the step of moving the position of the particular circuit layout cell, comprises the step of shifting the particular layout cell within the same row and without losing topological equivalence.

18. A method according to claim 15, wherein in the first layout, the plurality of circuit layout cells are arranged in rows,

and wherein the step of moving the position of the particular circuit layout cell, comprises the step of moving the particular layout cell into an adjacent row of layout cells.

34. A method according to any of claims 1, 3, 6-11 and 15, further comprising the step of the computer system storing accessibly to the computer system a revised layout including at least one of the inserted filler cells.

19. A system for laying out an integrated circuit design, for use with a database defining a plurality of filler cell designs, the layout being for use in fabricating an integrated circuit device according to the design, comprising:

means for providing a first layout of the integrated circuit design, the first layout defining a plurality of masks, the masks defining a plurality of integrated circuit features when applied in a fabrication process, the features defining a plurality of circuit layout cells having gaps therebetween; and

means for inserting into each given gap in at least a subset of the gaps, a corresponding filler cell selected from the database in dependence upon a desired effect on a performance parameter of at least one circuit cell adjacent to the given gap.

20. A system according to claim 19, wherein in the first layout, the plurality of circuit layout cells are arranged in rows, each of the gaps being disposed in one of the rows between a corresponding pair of the circuit cells in the same row,

and wherein the means for inserting a corresponding filler cell into each given gap, comprises means for selecting the corresponding filler cell in dependence upon effects desired on a performance parameter of both circuit cells adjacent to the given gap.

21. A system according to claim 19, further comprising means for moving the position of a particular one of the circuit layout cells in order to make space for one of the corresponding filler cells.

22. A system according to claim 21, wherein the means for moving comprises means for moving the position of the particular circuit layout cell in a manner that retains topological equivalence.

23. A system according to claim 21, wherein in the first layout, the plurality of circuit layout cells are arranged in rows,

and wherein the means for moving the position of the particular circuit layout cell, comprises means for shifting the particular layout cell within the same row and without losing topological equivalence.

24. A system according to claim 21, wherein in the first layout, the plurality of circuit layout cells are arranged in rows,

and wherein the means for moving the position of the particular circuit layout cell, comprises means for moving the particular layout cell into an adjacent row of layout cells.

25. A system according to claim 19, wherein the means for inserting a corresponding filler cell comprises means for inserting a first filler cell in a gap adjacent to a subject circuit layout cell, the first filler cell including a dummy diffusion region longitudinally aligned with a diffusion region of an N-channel transistor in the subject circuit layout cell.

26. A system according to claim 19, wherein the fabricating of the integrated circuit device includes applying an etch stop layer over gate stack layers of the integrated circuit device,

wherein the means for inserting a corresponding filler cell comprises means for inserting a first filler cell in a gap adjacent to a subject circuit layout cell, the first filler cell including a transversely oriented dummy polysilicon line.

27. A system according to claim 19, wherein the means for inserting a corresponding filler cell comprises the step of inserting a first filler cell in a gap adjacent to a subject circuit layout cell, the first filler cell including a dummy contact region.

28. A system according to claim 19, wherein a subject circuit layout cell includes an N-well formed below P-channel transistors and not below N-channel transistors, the N-well having a longitudinally oriented well boundary,

and wherein the means for inserting a corresponding filler cell comprises means for inserting a first filler cell in a gap adjacent to the subject circuit layout cell, the first filler cell including an N-well boundary, at least a portion of which being not in-line with the N-well boundary of the N-well in the subject circuit layout cell.

29. A system according to claim 19, wherein the fabricating of the integrated circuit device includes applying an etch stop layer over gate stack layers of the integrated circuit device, the etch stop layer having a longitudinally oriented boundary,

and wherein the means for inserting a corresponding filler cell comprises means for inserting a first filler cell in a gap adjacent to a subject circuit layout cell, the first filler cell including an etch stop layer boundary, at least a portion of which being not in-line with the etch stop layer boundary in the subject circuit layout cell.

30. A system according to claim 19, wherein the desired effect on a performance parameter includes improving transistor electron mobility in a CMOS circuit in a subject circuit layout cell,

and wherein the means for inserting a corresponding filler cell comprises means for inserting a first filler cell in a gap adjacent to a subject circuit layout cell, the first filler cell including a dummy diffusion region longitudinally aligned with the diffusion region of an N-channel transistor in the subject circuit layout cell, the first filler cell lacking any diffusion region longitudinally aligned with the diffusion region of any P-channel transistor in the subject circuit layout cell.

31. A system according to claim 19, wherein the desired effect on the performance parameter derives at least in part from stress effects.

32. A system according to claim 19, wherein the desired effect on the performance parameter derives at least in part from optical proximity effects.

33. A system according to claim 19, wherein the desired effect on the performance parameter derives at least in part from the well proximity effect.