Disk drive prioritizing in-the-field defect scanning based on number of write operations in each of a plurality of defect zones

• US 7,929,234 B1
• Filed: 03/27/2009
• Issued: 04/19/2011
• Est. Priority Date: 03/27/2009
• Status: Active Grant

• Current Assignee: Western Digital Technologies Incorporated (Western Digital Corporation)
• Original Assignee: Western Digital Technologies Incorporated (Western Digital Corporation)
• Inventors: Pei, Anthony L., Boyle, William B., Tsai, Chun Sei
• Primary Examiner(s): Olson; Jason C
• Application Number:
  US12/413,408
• Time in Patent Office: 753 Days
• Field of Search: None
• US Class Current: 360/31
• CPC Class Codes: G11B 20/1879 Direct read-after-write methods
• CPC Class Codes: G11B 20/1889 with discs
• CPC Class Codes: G11B 2220/2516 Hard disks

Abstract

A disk drive is disclosed comprising a head actuated over a disk, the disk having a plurality of data tracks, wherein a first plurality of data tracks comprises a first plurality of defect scanned data sectors and a second plurality of data tracks comprises a second plurality of unscanned data sectors. The second plurality of data tracks is divided into a plurality of defect zones. A first number of write commands are received from a host to write data to a first defect zone. A first data sector in the first defect zone is defect scanned in response to the first number of write commands to the first defect zone.

Claims

1. A disk drive comprising:

a disk comprising a plurality of data tracks, wherein a first plurality of data tracks comprises a first plurality of defect scanned data sectors and a second plurality of data tracks comprises a second plurality of unscanned data sectors;

a head actuated over the disk; and

control circuitry operable to;

divide the second plurality of data tracks into a plurality of defect zones;

receive a first number of write commands from a host to write data to a first defect zone; and

defect scan a first data sector in the first defect zone in response to the first number of write commands to the first defect zone.

2. The disk drive as recited in claim 1, wherein the control circuitry is further operable to defect scan the first data sector when the first number of write commands to the first defect zone exceeds a threshold.

3. The disk drive as recited in claim 1, wherein the control circuitry is further operable to defect scan the first data sector when a frequency of the first write commands to the first defect zone exceeds a threshold.

4. The disk drive as recited in claim 1, wherein the control circuitry is further operable to defect scan the first data sector by:

writing a pattern to the first data sector; and

reading the pattern from the first data sector.

5. The disk drive as recited in claim 1, wherein the control circuitry is further operable to:

write user data received from the host in connection with one of the write commands to a second data sector of the first defect zone;

write verify the second data sector; and

when the write verify fails, relocate the second data sector.

6. The disk drive as recited in claim 5, wherein after defect scanning the first data sector the control circuitry is further operable to:

write user data received from the host in connection with one of the write commands to the first data sector of the first defect zone; and

skip the write verify of the first data sector.

7. The disk drive as recited in claim 1, wherein the control circuitry is further operable to:

receive a second number of write commands from the host to write data to a second defect zone; and

defect scan a second data sector in the second defect zone in response to the first number of write commands to the first defect zone and the second number of write commands to the second defect zone.

8. The disk drive as recited in claim 7, wherein the control circuitry is further operable to:

increment a first zone counter each time a write command is received to write data to the first defect zone; and

increment a second zone counter each time a write command is received to write data to the second defect zone.

9. The disk drive as recited in claim 8, wherein the control circuitry is operable to defect scan the second data sector before the first data sector when the second zone counter exceeds the first zone counter.

10. The disk drive as recited in claim 9, wherein during an idle time the control circuitry is further operable to select one of the first defect zone and the second defect zone for defect scanning.

11. The disk drive as recited in claim 1, wherein the control circuitry is further operable to update a defect table identifying the first data sector as defect scanned.

12. The disk drive as recited in claim 5, wherein the control circuitry is further operable to:

update a write table identifying the second data sector as written; and

when defect scanning data sectors in the first defect zone, skip the defect scan of the second data sector.

13. A method of operating a disk drive, the disk drive comprising a head actuated over disk, the disk comprising a plurality of data tracks, wherein a first plurality of data tracks comprises a first plurality of defect scanned data sectors and a second plurality of data tracks comprises a second plurality of unscanned data sectors, the method comprising:

dividing the second plurality of data tracks into a plurality of defect zones;

receiving a first number of write commands from a host to write data to a first defect zone; and

defect scanning a first data sector in the first defect zone in response to the first number of write commands to the first defect zone.

14. The method as recited in claim 13, further comprising defect scanning the first data sector when the first number of write commands to the first defect zone exceeds a threshold.

15. The method as recited in claim 13, further comprising defect scanning the first data sector when a frequency of the first write commands to the first defect zone exceeds a threshold.

16. The method as recited in claim 13, wherein defect scanning the first data sector comprises:

writing a pattern to the first data sector; and

reading the pattern from the first data sector.

17. The method as recited in claim 13, further comprising:

writing user data received from the host in connection with one of the write commands to a second data sector of the first defect zone;

write verifying the second data sector; and

when the write verifying fails, relocating the second data sector.

18. The method as recited in claim 17, wherein after defect scanning the first data sector:

writing user data received from the host in connection with one of the write commands to the first data sector of the first defect zone; and

skipping the write verify of the first data sector.

19. The method as recited in claim 13, further comprising:

receiving a second number of write commands from the host to write data to a second defect zone; and

defect scanning a second data sector in the second defect zone in response to the first number of write commands to the first defect zone and the second number of write commands to the second defect zone.

20. The method as recited in claim 19, further comprising:

incrementing a first zone counter each time a write command is received to write data to the first defect zone; and

incrementing a second zone counter each time a write command is received to write data to the second defect zone.

21. The method as recited in claim 20, further comprising defect scanning the second data sector before the first data sector when the second zone counter exceeds the first zone counter.

22. The method as recited in claim 21, wherein during an idle time further comprising selecting one of the first defect zone and the second defect zone for defect scanning.

23. The method as recited in claim 13, further comprising updating a defect table identifying the first data sector as defect scanned.

24. The method as recited in claim 17, further comprising:

updating a write table identifying the second data sector as written; and

when defect scanning data sectors in the first defect zone, skipping the defect scan of the second data sector.