Microcontactor probe with reduced number of sliding contacts for Conduction, and electric probe unit

• US 7,969,170 B2
• Filed: 07/16/2008
• Issued: 06/28/2011
• Est. Priority Date: 06/16/2000
• Status: Expired due to Fees

• Current Assignee: NHK Spring Company Limited
• Original Assignee: NHK Spring Company Limited
• Inventors: Kazama, Toshio
• Primary Examiner(s): Nguyen; Vinh P
• Application Number:
  US12/219,099
• Publication Number:
  US 20090009205A1
• Time in Patent Office: 1,077 Days
• Field of Search: None
• US Class Current: 324/754.01
• CPC Class Codes: G01R 1/06722 Spring-loaded
• CPC Class Codes: G01R 1/06772 High frequency probes

Abstract

In order for a conduction path to have a reduced number of sliding portions for conduction, without increase in inductance nor resistance, thereby permitting an enhanced accuracy of inspection, a pair of plungers (3, 4) biased in opposite directions by a coil spring (2), to be electrically connected to a wiring plate (10), have electrical connections in which, in a tubular portion (15) as a tight wound spiral portion (15a) fixed on one plunger (4) to allow linear flow of electrical signal, the other plunger (3) is brought into slidable contact.

Claims

1. A microcontactor probe comprising:

an insulating holder formed with a support hole;

a lead conductor exposed to the support hole; and

a resilient conductive assembly fitted in the support hole and kept from falling, the conductive assembly comprising;

a first plunger adapted to be exposed outside the support hole;

a second plunger adapted to contact the lead conductor; and

a coil spring biasing the first and second plungers in opposite directions, the coil spring having fixed ends to the first and second plungers for electrical conduction and a continuous tubular tight wound portion,

the tight wound portion including;

a sliding conduction part configured for one of the first and second plungers to slidably contact thereon for electrical conduction; and

a fixed conduction part configured for the other of the first and second plungers to be fixed thereto for electrical conduction.

2. A microcontactor probe according to claim 1,

wherein said one of the first and second plungers corresponds to the second plunger, and said other of the first and second plungers corresponds to the first plunger.

3. A microcontactor probe according to claim 1, further comprising:

an auxiliary spring positioned outside of the coil spring fitted on the first and second plungers, thereby enhancing stability of at least one of the first and second plungers.

4. A microcontactor probe according to claim 1, further comprising:

an auxiliary spring positioned outside of the coil spring fitted on the first and second plungers and having an opposite winding direction to the coil spring fitted on the first and second plungers, thereby enhancing stability of at least one of the first and second plungers.

5. An electric probe unit comprising a plurality of microcontactor probes according to claim 1.

6. An electric probe module comprising:

an insulating holder formed with a support hole; and

a resilient conductive assembly fitted in the support hole and kept from falling, the conductive assembly comprising;

a first plunger adapted to be exposed at an end of the support hole;

a second plunger facing another end of the support hole; and

a coil spring biasing the first and second plungers in opposite directions, the coil spring having fixed ends to the first and second plungers for electrical conduction and a continuous tubular tight wound portion,

the tight wound portion comprising;

a sliding conduction part configured for one of the first and second plungers to slidably contact thereon for electrical conduction; and

a fixed conduction part configured for the other of the first and second plungers to be fixed thereto for electrical conduction.

7. A microcontactor probe according to claim 6,

wherein said one of the first and second plungers corresponds to the second plunger, and said other of the first and second plungers corresponds to the first plunger.

8. A microcontactor probe according to claim 6, further comprising:

an auxiliary spring positioned outside of the coil spring fitted on the first and second plungers, thereby enhancing stability of at least one of the first and second plungers.

9. A microcontactor probe according to claim 6, further comprising:

an auxiliary spring positioned outside of the coil spring fitted on the first and second plungers and having an opposite winding direction to the coil spring fitted on the first and second plungers, thereby enhancing stability of at least one of the first and second plungers.

10. An electric probe unit comprising a plurality of microcontactor probes according to claim 6.