Analog boundary scanning based on stray capacitance

• US 7,986,313 B2
• Filed: 01/03/2007
• Issued: 07/26/2011
• Est. Priority Date: 01/03/2007
• Status: Expired due to Fees

• Current Assignee: Apple Inc.
• Original Assignee: Apple Inc.
• Inventors: Krah, Christoph Horst
• Primary Examiner(s): NGUYEN, KIMNHUNG T
• Application Number:
  US11/650,511
• Publication Number:
  US 20080157782A1
• Time in Patent Office: 1,665 Days
• Field of Search: 345173-179, 345/204, 178 1801- 1806, 714/27
• US Class Current: 345/204
• CPC Class Codes: G01R 31/2815 Functional tests, e.g. boundary scans, using the normal I/O contacts contacting devices G01R31/2808; testing digital circuits G01R31/317, G06F11/00
• CPC Class Codes: G01R 31/70 Testing of connections between components and printed circuit boards G01R31/68 takes precedence

Abstract

Embodiments of the present invention are directed to performing boundary scanning without using a pin which is exclusively dedicated for that purpose. The boundary scan can be performed by an integrated circuit by utilizing a pin which has an alternative use during ordinary operation of the integrated circuit and the device. This pin can be connected to an analog circuit configured to sense capacitance outside of the pin. The analog circuit may also have an alternative function in normal operation of the device. During a testing mode, the analog circuit can sense a stray capacitance present at the pin. The sensed capacitance can be compared to one or more stored expected capacitance values to determine an interconnection state of the system.

Claims

1. An integrated circuit capable of performing a boundary scan, comprising:

a plurality of pins; and

an interface circuit connected to a pin that is one of the plurality of pins, and configured to operate in;

a boundary scan mode to obtain a signal indicative of a stray capacitance present at the pin, the stray capacitance representative of a connection state of one or more external elements in relation to the pin, and

an ordinary operation mode to perform functions related to an ordinary operation of the integrated circuit, said functions being distinct from any boundary scan operations.

2. The integrated circuit of claim 1, wherein the connection state of the one or more external elements in relation to the pin is associated with a set of one or more external elements connected to the pin in series.

3. The integrated circuit of claim 2, wherein each of the one or more external elements has a stray capacitance associated therewith, and the stray capacitance sensed by the interface circuit is the sum of the stray capacitances of the set of one or more connected elements.

4. The integrated circuit of claim 1, wherein the connection state of the one or more external elements in relation to the pin is a state of absence of any connection between the external elements and the pin.

5. The integrated circuit of claim 1, wherein at least one element of the interface circuit is used in both boundary scan and ordinary operation modes.

6. The integrated circuit of claim 5, wherein the at least one element used in both modes includes an operational amplifier.

7. The integrated circuit of claim 6, wherein the operational amplifier is used in inverting mode when the interface circuit is operating in ordinary operation mode, and in non-inverting mode, when the interface circuit is operating in boundary scan mode.

8. The integrated circuit of claim 1, wherein the integrated circuit further comprises a memory and a comparison module,

the memory including one or more predefined expected capacitance values, wherein each expected capacitance value is associated with a respective set of one or more external elements which together cause a stray capacitance equal to the expected capacitance value,

the comparison module being configured to receive the signal indicative of the stray capacitance, derive a stray capacitance value from it and compare the derived stray capacitance value to the one or more predefined expected capacitance values in order to determine which set of one or more external elements is connected to the pin.

9. The integrated circuit of claim 8, wherein the memory further includes an expected capacitance value associated with an indication that no external elements are connected to the pin and the comparison module is further configured to determine that no external elements are connected to the pin.

10. The integrated circuit of claim 8, wherein the comparison module comprises a programmable processor.

11. The integrated circuit of claim 8, further including two or more internal malfunction expected capacitance values associated with a single set of one or more external elements, wherein the internal malfunction expected capacitance values are associated with different expected capacitances which can result from the presence or absence of internal malfunctions of one or more elements of the single set of one or more external elements.

12. The integrated circuit of claim 1, wherein the interface circuit is configured to switch between ordinary operation and boundary scan mode based on external control signals.

13. The integrated circuit of claim 1, wherein the interface circuit is configured to obtain a signal indicative of an external condition in the ordinary operation mode.

14. The integrated circuit of claim 13, wherein the interface circuit is configured to:

process and digitize the signal indicative of an external condition during ordinary operation mode; and

to process and digitize the signal indicative of the stray capacitance present at the pin,

wherein the processing and digitizing of the two signals during the two modes is performed using the same circuitry.

15. The integrated circuit of claim 13, wherein one of the one or more external elements is a touch sensitive panel, and the external condition is a touch event on the touch panel.

16. The integrated circuit of claim 13, wherein one of the one or more external elements is a proximity sensitive panel, and the external condition is a hover event at the proximity sensitive panel.

17. The integrated circuit of claim 1, wherein the integrated circuit further includes a plurality of interface circuits and associated pins.

18. The integrated circuit of claim 1, wherein the device is a mobile telephone.

19. The integrated circuit of claim 1, wherein the device is a digital audio player.

20. The integrated circuit of claim 1, the integrated circuit incorporated into a mobile telephone, the mobile telephone comprising:

a printed circuit board; and

a touch sensitive panel mounted on the printed circuit board;

wherein the integrated circuit is mounted on the printed circuit board and includes an analog channel connected to the pin and configured to

operate in the boundary scan and ordinary operation modes,

sense a stray capacitance at the pin in the boundary scan mode, and

sense a touch event on the touch sensitive panel in the ordinary operation mode.

21. The integrated circuit of claim 1, the integrated circuit incorporated into a digital audio player, the digital audio player comprising:

a printed circuit board; and

a touch sensitive panel mounted on the printed circuit board;

wherein the integrated circuit is mounted on the printed circuit board and includes an analog channel configured to

operate in the boundary scan and ordinary operation modes,

sense a stray capacitance at the pin in the boundary scan mode, and

sense a touch event on the touch sensitive panel in the ordinary operation mode.

22. The integrated circuit of claim 1, the integrated circuit incorporated into an electronic device, the electronic device comprising:

a printed circuit board; and

a touch sensitive panel mounted on the printed circuit board;

wherein the integrated circuit is mounted on the printed circuit board and includes an analog channel configured to

operate in the boundary scan and ordinary operation modes,

sense a stray capacitance at the pin in the boundary scan mode, and

sense a touch event on the touch sensitive panel in the ordinary operation mode; and

wherein the touch sensitive panel is stimulated with a stimulation signal during ordinary operation mode but not during a sleep mode.

23. The integrated circuit of claim 22, wherein:

the electronic device is also configured to operate in sleep and ordinary operation modes which coincide with sleep and ordinary operation modes of the analog channel; and

the integrated circuit is configured to note changes of the sensed stray capacitance at the pin which indicate a touch event on the touch panel and, in response to said changes, change the mode of the electronic device from sleep mode to ordinary operation.

24. The integrated circuit of claim 1, the integrated circuit incorporated into an electronic device, the electronic device comprising:

a printed circuit board; and

a touch sensitive panel coupled to the printed circuit board;

wherein the integrated circuit is mounted on the printed circuit board and includes an analog channel connected to the pin and configured to

operate in the boundary scan and ordinary operation modes,

sense a stray capacitance at the pin in the boundary scan mode, and

sense a touch event on the touch sensitive panel in the ordinary operation mode.

25. The integrated circuit of claim 24, wherein the stray capacitance is indicative of which elements are connected to the pin.

26. The integrated circuit of claim 25, further comprising a comparison module connected to the analog channel and configured to receive the sensed stray capacitance from the analog channel and determine whether the printed circuit board is electrically connected to the pin based on the stray capacitance.

27. The integrated circuit of claim 26, wherein the comparison module is further configured to determine whether the touch sensitive panel is electrically connected to the pin through the printed circuit board based on the stray capacitance.

28. The integrated circuit of claim 26, further comprising a memory comprising one or more expected capacitance values, wherein the comparison module is configured to make said determination based on a comparison of the sensed stray capacitance with one or more of the one or more expected capacitance values.

29. The integrated circuit of claim 26, wherein the comparison module comprises a touch panel processor.

30. The integrated circuit of claim 25, wherein the analog channel comprises an operational amplifier and the operational amplifier is used in both modes.

31. The integrated circuit of claim 30, wherein:

a first input of the operational amplifier is connected to the pin and a second input of the operational amplifier is not connected to the pin;

during the ordinary operation mode, the first input receives an oscillating signal; and

during the boundary scan mode, the second input receives an oscillating signal.

32. The integrated circuit of claim 25, wherein the analog channel is configured to generate:

a first signal indicative of the presence of a touch event in the ordinary operation mode; and

a second signal indicative of the stray capacitance in the boundary scan mode;

wherein the analog channel further includes processing circuitry for processing and digitizing a generated signal, said processing circuitry being used for both the first signal in the ordinary operation mode and the second signal in the boundary scan mode.

33. The integrated circuit of claim 24, further including a plurality of analog channels and a plurality of respective pins, wherein each analog channel senses a touch event in the ordinary operation mode and senses a stray capacitance in the boundary scan mode independently of the others.

34. The integrated circuit of claim 24, wherein the electronic device is a mobile telephone.

35. The integrated circuit of claim 24, wherein the electronic device is a digital audio player.

36. A method for operating an integrated circuit having a pin and an interface circuit connected thereto, the method comprising:

placing the interface circuit in boundary scan mode;

sensing by the interface circuit a stray capacitance present at the pin, the stray capacitance indicative of a state of connection of the integrated circuit;

placing the interface circuit in an ordinary operation mode; and

performing a first function related to an ordinary operation of the integrated circuit by the interface circuit.

37. The method of claim 36, further including:

comparing the sensed stray capacitance to one or more predefined expected capacitance values; and

determining the state of connection of one or more external elements in relation to the pin based on the comparison, the external elements being external to the integrated circuit.

38. The method of claim 37, wherein each predefined capacitance value indicates a different state of connection, each state of connection indicating which external elements are connected to the pin, if any.

39. The method of claim 38, wherein placing the interface circuit in boundary scan mode, sensing by the interface circuit a stray capacitance, comparing the sensed stray capacitance to expected capacitance values and determining the state of connections are initially performed at a first stage of manufacture at which a first set of external elements are placed in an assembly including the integrated circuit.

40. The method of claim 39, wherein said steps are performed again at a second stage of manufacture, the second stage being such that a second set of external elements are placed in the assembly including the integrated circuit and the first set of elements.

41. The method of claim 36, wherein:

the integrated circuit is connected to a touch panel;

the interface circuit is an analog channel;

the first function includes sensing a touch event at the touch panel by the analog channel; and

at least a portion of the stray capacitance sensed at the pin is contributed by the touch panel.

42. The method of claim 41, wherein placing the interface circuit in a boundary scan mode further includes:

sending a stimulation signal to the analog channel; and

grounding all inputs of the touch panel.

43. The method of claim 42, wherein placing the interface circuit in an ordinary operation mode further includes:

sending a stimulation signal to the touch panel; and

sending a reference signal to the analog channel.

44. The method of claim 41, wherein the integrated circuit further includes a plurality of analog channels and a plurality of respective pins connected thereto, and wherein the sensing by the analog channel a stray capacitance present at the pin, and the sensing a touch event at the touch panel are performed in parallel by the plurality of analog channels.

45. The method of claim 44, wherein each analog channel is associated with a respective output electrode of the touch panel.

46. The method of claim 36, wherein the sensing by the interface a stray capacitance includes generating a first signal indicative of the stray capacitance by an amplifier circuit and the performing a first function includes generating a second signal indicative of an external condition by said amplifier circuit.

47. The method of claim 46, wherein the external condition is a touch event on a touch panel.

48. The method of claim 46, wherein the external condition is a hover event on a proximity sensor panel.

49. The method of claim 46, wherein:

the sensing of a stray capacitance further comprises processing and digitizing the first signal; and

the performing a first function further comprises processing and digitizing the second signal,

wherein the processing and digitizing the first and second signals is performed by the same circuitry of the interface circuit.

50. A device comprising:

an integrated circuit comprising a connection means, and a multimode means connected to the connection means; and

one or more external elements configurable to form different states of connection in relation to the connection means,

wherein the multi mode means is configured to operate in an ordinary operation and boundary scan modes, the multi mode means being further configured to;

in boundary scan mode, obtain a signal indicative of a stray capacitance representative of the connection state of the one or more external elements in relation to the connection means, and

in ordinary operation mode, perform functions related to the ordinary operation of the device, said functions being distinct from any boundary scan operations.