Method of error compensation in a coordinate measuring machine

• US 8,001,859 B2
• Filed: 06/26/2009
• Issued: 08/23/2011
• Est. Priority Date: 09/22/2003
• Status: Expired due to Fees

• Current Assignee: Renishaw PLC
• Original Assignee: Renishaw PLC
• Inventors: Trull, Stephen James, McFarland, Geoff, Nai, Kenneth Cheng-Hoe, Weston, Nicholas John, McMurtry, David Roberts
• Primary Examiner(s): Raevis; Robert R
• Application Number:
  US12/457,958
• Publication Number:
  US 20100005852A1
• Time in Patent Office: 788 Days
• Field of Search: None
• US Class Current: 73/866.5
• CPC Class Codes: G01B 21/042 Calibration or calibration artifacts G01B3/30, G01B9/02072 take precedence
• CPC Class Codes: G01B 21/045 Correction of measurements G01B9/02055 takes precedence
• CPC Class Codes: G01B 3/30 Bars, blocks, or strips in which the distance between a pair of faces is fixed, although it may be preadjustable, e.g. end measure, feeler strip
• CPC Class Codes: G01B 5/012 Contact-making feeler heads therefor

Abstract

A method of calibrating an articulating probe head comprising the steps of measuring an artefact of known dimensions with the workpiece sensing probe mounted on the articulating probe head, in which the articulating probe head is unlocked. An error functional map is generated corresponding to the difference between the measured and known dimensions of the artefact. Subsequent workpieces are measured with the articulating probe head unlocked and the corresponding correction applied. The true dimensions of the artefact may be determined by measuring it with a probe mounted on an articulating probe head in which the axes of the articulating probe head are locked. A mechanical lock is provided to lock the axes of the articulating probe head.

Claims

1. An articulating probe head comprising a first mount for mounting on a support and a second mount onto which a surface sensing device may be mounted, the second mount being rotatable relative to the first mount about one or more axis, wherein the articulated probe head is provided with at leak one mechanical brake to lock the position of the second mount relative to the first mount about at least one axis and whereby at least one position measuring device is provided to determine the position of the second mount relative to the first mount about said at least one axis in the locked position.

2. An articulating probe head according to claim 1, wherein the articulating probe head includes a rotary member rotatable about at least one axis, and wherein the brake has a lock member which moves between first and second positions, in a first position the lock member engages the rotary member to lock the rotary member in position and in a second position the lock member disengages the rotary member, allowing the rotary member to rotate.

3. An articulating probe head according to claim 2, wherein the rotary member comprises a drive belt.

4. An articulating probe head according to claim 2, wherein the rotary member comprises a driven wheel.

5. An articulating probe head according to claim 2, wherein the rotary member is provided with a toothed profile and wherein the lock member comprises a toothed lock assembly, such that in the first position the teeth of the lock assembly and the rotary member interlock.

6. An articulating probe head according to claim 2, wherein the lock has an actuator to move the lock member between the first and second positions.

7. An articulating probe head according to claim 6, wherein the point of contact between the actuator and the lock member is separated transversely from the point of contact between the lock member and the rotary member.

8. An articulating probe head according to claim 7, wherein the lock member comprises a lever assembly pivotable about a pivot point and wherein the point of contact between the lock member and the rotary member is located between the pivot point and the point of contact between the actuator and the lock member.

9. An articulating probe head according to claim 2, wherein the lock member comprises a lever assembly.

10. An articulating probe head according to claim 2, wherein biasing means is provided to bias the lock member against the rotary member when the lock member is in the first position.

11. An articulating probe head according to claim 1, wherein at least one actuator is provided for fine adjustment of the position of the second mount relative to the first mount about the at least one axis.

12. An articulating probe head according to claim 11, wherein feedback from the position measuring device is used to determine the amount of adjustment required.

13. An articulating probe head according to claim 11, wherein the articulating probe head includes a rotary member rotatable about at least one axis, and wherein the brake has a lock member which moves between first and second positions, in the first position the lock member engages the rotary member to lock the rotary member in position and in the second position the lock member disengages the rotary member, allowing the rotary member to rotate and whereby the at least one actuator acts to change the position of the lock member whilst it is engaged with the rotary member.

14. An articulating probe head according to claim 11, in which the at least one actuator comprises at least one piezo stack.