JTAG debug test system adapter with three sets of leads

• US 8,136,003 B2
• Filed: 05/10/2010
• Issued: 03/13/2012
• Est. Priority Date: 03/21/2005
• Status: Active Grant

• Current Assignee: Texas Instruments, Inc.
• Original Assignee: Texas Instruments, Inc.
• Inventors: Swoboda, Gary L.
• Primary Examiner(s): Tu, Christine
• Application Number:
  US12/776,579
• Publication Number:
  US 20100223519A1
• Time in Patent Office: 673 Days
• Field of Search: 714733-734, 714/731, 714724-726, 714/744, 714/798, 714814-815, 714/30, 714/37
• US Class Current: 714/726
• CPC Class Codes: G01R 31/31705 Debugging aspects, e.g. using test circuits for debugging, using dedicated debugging test circuits generation of test sequences therefor G01R31/31835, using scan test therefor G01R31/318544
• CPC Class Codes: G01R 31/31723 Hardware for routing the test signal within the device under test to the circuits to be tested, e.g. multiplexer for multiple core testing, accessing internal nodes routing the test signal to or from the device under test G01R31/31926
• CPC Class Codes: G01R 31/31724 Test controller, e.g. BIST state machine for scan test G01R31/318555
• CPC Class Codes: G01R 31/31727 Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks G01R31/31725 takes precedence; concerning scan test G01R31/318552, for tester hardware G01R31/31922
• CPC Class Codes: G01R 31/3177 Testing of logic operation, e.g. by logic analysers
• CPC Class Codes: G01R 31/318536 Scan chain arrangements, e.g. connections, test bus, analog signals
• CPC Class Codes: G01R 31/318544 Scanning methods, algorithms and patterns G01R31/3183 takes precedence
• CPC Class Codes: G01R 31/318572 Input/Output interfaces

Abstract

A system and method for sharing a communications link between multiple protocols is described. A system includes a communications interface configured to exchange information with other systems using at least one of a plurality of protocols; a protocol select register that stores a value that selects a protocol from among the plurality of protocols to become an active protocol; and a state machine accessible to the communications interface, the state machine used to control the exchange of information through the communications interface according to the active protocol. The active protocol is used by the communications interface to exchange information while the remaining protocols of the plurality of protocols remain inactive. The state machine sequences through a series of states that cause the communications interface to operate according to the active protocol, and that are designated as inert sequences under the remaining protocols.

Claims

1. A debug test system adapter comprising:

A. a first set of leads including;

i. a clock input and output lead,

ii. a mode input and output lead,

iii. a test in data output lead, and

iv. a test out data input lead;

B. a second set of leads including;

i. a test clock input lead carrying a test clock signal coupled to the clock input and output lead,

ii. a test mode select input lead carrying a test mode select signal coupled to the mode input and output lead,

iii. a test in data input lead carrying a test in data signal selectively coupled to the test in data output lead and the mode input and output lead, and

iv. a test out data output lead carrying a test out data signal selectively coupled to the test out data input lead and the mode input and output lead; and

C. a third set of leads including first and second data transport leads selectively coupled with the mode input and output lead.

2. The adapter of claim 1 in which the first set of leads include a return clock input.

3. The adapter of claim 1 in which the second set of leads include a test clock output coupled with the clock input and output lead.

4. The adapter of claim 1 including multiplexer circuitry having first multiplexer leads connected with the first set of leads, second multiplexer leads connected with the second set of leads, third multiplexer leads, and a control input lead carrying a signal indicating selectively coupling one of the second and third multiplexer leads with the first multiplexer leads, serializer circuitry having first serializer leads connected with the third set of leads and second serializer leads connected with the third multiplexer leads, and format select register circuitry having a control output lead connected with the control input lead.

5. The adapter of claim 1 including a multiplexer having an input connected to the test data out input lead, a second input, an output connected to the test data out output lead, and a control input, and control circuitry having a test data out-B output connected to the second input and a control output connected to the control input, the test data out-B output lead being coupled to the mode input and output lead.

6. The adapter of claim 1 including control logic connected to the second set of leads.