Methods for measurement and characterization of interferometric modulators

• US 8,274,299 B2
• Filed: 09/30/2008
• Issued: 09/25/2012
• Est. Priority Date: 02/11/2008
• Status: Expired due to Fees

• Current Assignee: Snaptrack Incorporated (Qualcomm, Inc.)
• Original Assignee: Qualcomm MEMS Technologies Incorporated (Qualcomm, Inc.)
• Inventors: Govil, Alok
• Primary Examiner(s): Natalini, Jeff
• Application Number:
  US12/242,770
• Publication Number:
  US 20090201033A1
• Time in Patent Office: 1,456 Days
• Field of Search: 324/713
• US Class Current: 324/713
• CPC Class Codes: G01R 31/2637 for testing other individual devices G01R31/2608 - G01R31/2632, G01R31/27 take precedence
• CPC Class Codes: G09G 2320/0693 Calibration of display systems
• CPC Class Codes: G09G 3/006 Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays testing individual LED's G01R31/2635; testing lamps G01R31/44; testing of optical features of LCD displays G02F1/1309
• CPC Class Codes: G09G 3/3466 based on interferometric effect

Abstract

Various methods are described to characterize interferometric modulators or similar devices. Measured voltages across interferometric modulators may be used to characterize transition voltages of the interferometric modulators. Measured currents may be analyzed by integration of measured current to provide an indication of a dynamic response of the interferometric modulator. Frequency analysis may be used to provide an indication of a hysteresis window of the interferometric modulator or mechanical properties of the interferometric modulator. Capacitance may be determined through signal correlation, and spread-spectrum analysis may be used to minimize the effect of noise or interference on measurements of various interferometric modulator parameters.

Claims

1. A method of measuring one or more electrical characteristics of a microelectromechanical system (MEMS) device, the method comprising:

applying a first signal to the MEMS device, wherein the first signal comprises a combination of a periodic electrical stimulus and a DC voltage;

measuring an output signal of the MEMS device over a period of time in which the DC voltage varies between at least a first value and a second value; and

combining a second signal with the output signal to obtain a resultant signal indicative of the one or more electrical characteristics of the MEMS device, wherein the second signal is orthogonal to the first signal.

2. The method of claim 1, further comprising filtering the resultant signal to reduce a time varying aspect of the resultant signal, the filtered resultant signal corresponding to a capacitance of the MEMS device.

3. The method of claim 1, wherein combining the second signal with the output signal comprises multiplying the second signal and the output signal.

4. The method of claim 1, wherein the resultant signal is indicative of a capacitance of the MEMS device.

5. The method of claim 1, wherein the resultant signal is indicative of power consumed in driving the MEMS device.

6. The method of claim 1, wherein the method further comprises identifying a transition voltage of the device based at least in part on the resultant signal.

7. The method of claim 1, the method additionally including generating the first signal, wherein the DC voltage is a DC driving voltage waveform, and wherein generating the first signal includes adding a sinusoidal electrical stimulus to a DC driving voltage waveform.

8. A device, comprising:

a microelectromechanical system (MEMS) device; and

circuitry configured to;

apply a first signal to the MEMS device, wherein the first signal comprises a combination of a periodic electrical stimulus and an offset voltage that varies between at least a first value and a second value;

measure an output signal of the MEMS device; and

combine the output signal with a second signal orthogonal to the first signal to obtain a resultant signal, the resultant signal indicative of one or more electrical characteristics of the MEMS device.

9. The device of claim 8, wherein the circuitry is further configured to multiply the output signal and the second signal.

10. The device of claim 8, wherein the circuitry is further configured to filter the resultant signal to obtain a substantially constant value, the substantially constant value corresponding to a capacitance of the device.

11. A device, comprising:

means for applying a first signal to a microelectromechanical (MEMS) systems device, wherein the first signal comprises a combination of a periodic electrical stimulus and an offset voltage which is switched between at least a first value and a second value;

means for measuring an output signal of the MEMS device; and

means for correlating the output signal with a second signal orthogonal to the output signal to obtain a resultant signal, the resultant signal indicative of one or more electrical characteristics of the MEMS device.

12. The device of claim 11, wherein the correlating means comprise a mixer configured to multiply the output signal and the second signal.

13. The device of claim 11, additionally comprising means for reducing a time-varying portion of the resultant signal.

14. The device of claim 13, wherein the reducing means comprise a filter.

15. A display module, comprising:

a display comprising a plurality of microelectromechanical system (MEMS) devices, wherein the MEMS devices include a movable electrode and a fixed electrode;

driver circuitry configured to drive the display; and

monitoring circuitry configured to;

apply a driving signal to at least one of the MEMS devices, wherein the driving signal comprises a combination of a periodic electrical signal and a DC driving voltage, wherein the DC driving voltage varies between at least a first value and a second value;

measure the current through the at least one of the MEMS devices; and

correlate the measured current with a second signal to obtain a resultant signal, the resultant signal indicative of one or more electrical characteristics of the at least one of the MEMS devices.

16. The display module of claim 15, wherein the plurality of MEMS devices comprise interferometric modulators.

17. The display module of claim 15, wherein the second signal is orthogonal to the driving signal.

18. The display module of claim 15, wherein correlating the measured current with the second signal comprises multiplying the measured current by the second signal.

19. The display module of claim 18, additionally comprising multiplying the resultant signal by the measured current to provide a signal indicative of a power used by the at least one of the MEMS devices.

20. The display module of claim 15, wherein the monitoring circuitry is further configured to filter the resultant signal to reduce a time varying aspect of the resultant signal, the filtered resulting signal comprising a substantially constant signal having a value proportional to a capacitance of the at least one of the MEMS devices.

21. The display module of claim 15, wherein the monitoring circuitry is further configured to identify a transition voltage of the devices based at least in part on the resultant signal.

22. The display module of claim 15, wherein the driving signal includes a combination of a first component waveform and a second component waveform, wherein the first component waveform is the periodic electrical signal and is a sinusoidal electrical signal, and wherein the second component waveform is the DC driving voltage which varies between at least the first value and the second value.