Multiple die stack package
First Claim
Patent Images
1. A semiconductor package comprising:
- a first IC device;
a second IC device;
a substrate, the first IC device being attached to the substrate and the second IC device being attached to the first IC device;
a first electrical connection between the first IC device and the substrate;
a second electrical connection between the second IC device and the substrate;
an electrical contact distributor, attached to one of the first or second IC devices in the semiconductor package;
wherein an electrical connection is connected to an associated electrical contact region with the electrical contact distributor; and
wherein the electrical contact distributor comprises at least one of a wafer distribution layer;
a substrate interposer;
a dielectric interposer; and
a metallic interposer;
an opening, through the substrate, from a first side of the substrate to which the first IC device is attached, to a second side of the substrate opposite the first side; and
an electrical contact region on the first IC device,wherein said first electrical connection passes through said opening and connects said electrical contact region on the first IC device to the second side of the substrate; and
wherein said electrical contact region on the first IC device includes a row of electrical contact regions on the first IC device, said row located substantially centrally on a first side of the first IC device, to which the substrate is attached.
4 Assignments
0 Petitions
Accused Products
Abstract
A semiconductor package, containing two or more stacked IC devices attached to a substrate. Each of the IC devices has a plurality of electrical contact regions which are connected to the substrate by means of electrical connections.
34 Citations
10 Claims
-
1. A semiconductor package comprising:
-
a first IC device; a second IC device; a substrate, the first IC device being attached to the substrate and the second IC device being attached to the first IC device; a first electrical connection between the first IC device and the substrate; a second electrical connection between the second IC device and the substrate; an electrical contact distributor, attached to one of the first or second IC devices in the semiconductor package; wherein an electrical connection is connected to an associated electrical contact region with the electrical contact distributor; and wherein the electrical contact distributor comprises at least one of a wafer distribution layer;
a substrate interposer;
a dielectric interposer; and
a metallic interposer;an opening, through the substrate, from a first side of the substrate to which the first IC device is attached, to a second side of the substrate opposite the first side; and an electrical contact region on the first IC device, wherein said first electrical connection passes through said opening and connects said electrical contact region on the first IC device to the second side of the substrate; and wherein said electrical contact region on the first IC device includes a row of electrical contact regions on the first IC device, said row located substantially centrally on a first side of the first IC device, to which the substrate is attached. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
-
Specification