Analysis system for analyzing a sample on a test element
First Claim
1. Analysis system for analyzing a sample on a test element having an outer region and an inner region, the inner region containing a sample application site, the system comprising:
- an analysis unit for generating a signal as a function of an analyte contained in the sample;
a detection unit for detecting the signal; and
a test element holder into which the test element can be reversibly introduced and in which the test element can be positioned relative to the analysis unit and the detection unit, the test element holder comprising a guide element which holds and laterally guides the test element, the guide element defining a gap extending along the length of the guide element, wherein the gap exposes the inner region of the underside of the test element such that the inner region remains free as the test element is removed from the guide element, whereby contamination of the analysis system from sample deposited on the test element is avoided.
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Abstract
The invention relates to an analysis system for analyzing a sample on a test element. The system has an analysis unit for generating a signal as a function of an analyte contained in a sample, and a detection unit for detecting the signal. The analysis system further includes a test element holder into which the test element can be reversibly introduced and in which it can be positioned relative to the analysis unit and the detection unit. The test element contains at least one guide element, which is suitable for laterally guiding the test element, so that the test element in the test element holder is held and guided only on an outer region of the test element, and an inner region of the test element introduced into the test element holder remains free. The test element contains a sample application site in the inner region.
15 Citations
36 Claims
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1. Analysis system for analyzing a sample on a test element having an outer region and an inner region, the inner region containing a sample application site, the system comprising:
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an analysis unit for generating a signal as a function of an analyte contained in the sample; a detection unit for detecting the signal; and a test element holder into which the test element can be reversibly introduced and in which the test element can be positioned relative to the analysis unit and the detection unit, the test element holder comprising a guide element which holds and laterally guides the test element, the guide element defining a gap extending along the length of the guide element, wherein the gap exposes the inner region of the underside of the test element such that the inner region remains free as the test element is removed from the guide element, whereby contamination of the analysis system from sample deposited on the test element is avoided. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
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19. An analysis system for analyzing a sample on a test element having an outer region and an inner region, the inner region containing a sample application site, the system comprising:
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an analysis unit for generating a signal as a function of an analyte contained in the sample;
a detection unit for detecting the signal;an optical window through which photometric evaluations are conducted; and a test element holder into which the test element can be reversibly introduced and in which the test element can be positioned relative to the analysis unit and the detection unit, the test element holder comprising a guide element which holds and laterally guides the test element and maintains the test element spaced from the optical window, wherein the guide element supports a bottom surface of the test element in the outer region of the test element and the guide element does not contact the bottom surface of the test element in the inner region of the test element and the inner region remains spaced from the optical window during the entire removal of the test element from the guide element, whereby contamination of the analysis system from sample deposited on the test element is avoided. - View Dependent Claims (20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36)
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Specification