Method for fast, robust, multi-dimensional pattern recognition
First Claim
1. In probe-based pattern matching, a method for locating patterns, the method comprising:
- providing a database that comprises;
a probe-based pattern model having;
a plurality of positive probes at selected points along a boundary of the pattern,at least one imaginary straight segment parallel to a segment of the boundary of the pattern, anda plurality of negative probes at selected points along the imaginary straight segment, each negative probe having a negative weight; and
providing a computer programmed to perform the step of;
using the probe-based pattern model, and probe-based pattern matching, to locate at least one instance of the pattern in an image.
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Abstract
Disclosed is a method for determining the absence or presence of one or more instances of a predetermined pattern in an image, and for determining the location of each found instance within a multidimensional space. A model represents the pattern to be found, the model including a plurality of probes. Each probe represents a relative position at which a test is performed in an image at a given pose, each such test contributing evidence that the pattern exists at the pose. The method further includes a comparison of the model with a run-time image at each of a plurality of poses. A match score is computed at each pose to provide a match score surface. Then, the match score is compared with an accept threshold, and used to provide the location any instances of the pattern in the image.
262 Citations
27 Claims
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1. In probe-based pattern matching, a method for locating patterns, the method comprising:
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providing a database that comprises; a probe-based pattern model having; a plurality of positive probes at selected points along a boundary of the pattern, at least one imaginary straight segment parallel to a segment of the boundary of the pattern, and a plurality of negative probes at selected points along the imaginary straight segment, each negative probe having a negative weight; and providing a computer programmed to perform the step of; using the probe-based pattern model, and probe-based pattern matching, to locate at least one instance of the pattern in an image. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21)
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22. In probe-based pattern matching, an apparatus for locating patterns, the apparatus comprising:
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a database including a probe-based pattern model, the model including; (i) a plurality of positive probes at selected points along a boundary of the pattern; (ii) at least one imaginary straight segment parallel to a segment of the boundary of the pattern; and (iii) a plurality of negative probes at selected points along the imaginary straight segment, each negative probe having a negative weight; and a computer readable memory including a program to perform the steps of; using the probe-based pattern model, and probe-based pattern matching, to locate at least one instance of the pattern in an image. - View Dependent Claims (23, 24, 25, 26, 27)
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Specification