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Data channel test apparatus and method thereof

  • US 8,392,767 B2
  • Filed: 02/23/2011
  • Issued: 03/05/2013
  • Est. Priority Date: 11/23/2007
  • Status: Expired due to Fees
First Claim
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1. A method for testing and configuring data channels of series-connected devices, each having input ports and output ports, the method comprising:

  • simultaneously asserting an input port enable and an output port enable signal to configure each port of the series-connected devices to simultaneously operate in a single-bit data width mode;

    applying a test pattern to M input ports of a first device of the series-connected devices, the M input ports having a corresponding M output ports at a last device of the series-connected devices, M being an integer number greater than one, each of the data channels defining a data path between corresponding pairs of input and output ports;

    transferring the test pattern from each of the M input ports of the first device to the corresponding M output ports of the last device of the series-connected devices if the data channels are functional;

    determining an absence of the test pattern from N output ports of the last device of the series-connected devices, N being an integer number not greater than M; and

    configuring each of the series-connected devices to have M-N active data channels.

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