Reconfigurable testing system and method

• US 8,402,313 B1
• Filed: 11/20/2007
• Issued: 03/19/2013
• Est. Priority Date: 05/01/2002
• Status: Expired due to Term

• Current Assignee: Monterey Research, LLC (Vector Capital Corporation)
• Original Assignee: Cypress Semiconductor Corporation (Infineon Technologies AG)
• Inventors: Pleis, Matthew A., Sullam, Bert, Lesher, Todd
• Primary Examiner(s): LE, DIEU MINH T
• Application Number:
  US11/986,338
• Time in Patent Office: 1,946 Days
• Field of Search: 714/30, 714/43, 714/7, 714/44, 714/724, 714/734, 713/100
• US Class Current: 714/30
• CPC Class Codes: G06F 11/273 Tester hardware, i.e. output processing circuits G06F11/263 takes precedence

Abstract

One disclosed system and method enables dynamic reconfiguration of an electronic device in association with testing activities in a convenient and efficient manner. In one implementation, the electronic device includes a bus for communicating information, a microprocessor for processing data, a programmable functional component including a plurality of functional blocks programmable to provide a plurality of functions and configurations, and a memory for storing instructions including instructions for causing the programmable functional component to change functions and configurations. The components are programmably configurable to perform a variety of functions. In one example, the memory stores a plurality of configuration images that define the configuration and functionality of the circuit. The information stored in the memory facilitates dynamic reconfiguration of the circuit in accordance with the test harness instructions. Based upon a command from a test computer, the electronic device is automatically reconfigured by the test harness activating different configuration images.

Claims

1. A reconfiguration testing method comprising:

reconfiguring a device under test in accordance with test harness commands to time multiplex device under test configurations while the device under test remains in a testing environment;

performing testing associated with the test harness commands for each of the time multiplexed device under test reconfigurations while the device under test remains in the testing environment; and

retrieving test result information for each of the time multiplexed device under test configurations while the device under test remains in a testing environment.

2. The method of claim 1, wherein the test harness is run in a background while waiting for a reconfiguration triggering event.

3. The method of claim 1, wherein the test harness instructions take over control of operations of the device under test and prevent other programs from interacting with the device under test while reconfiguring is being implemented.

4. The method of claim 1, wherein the test harness instructions are configured to determine characteristics for a variety of configurations over a range of different environmental conditions.

5. The method of claim 4, wherein the characteristics include accuracy of the device under test.

6. The method of claim 4, wherein the characteristics include a frequency at which the device under test operates.

7. The method of claim 4, wherein the characteristics include performance of the device under test.

8. The method of claim 4, wherein the characteristics include corner characteristics of the device under test.

9. The method of claim 1, wherein the reconfiguring comprises operationally smooth on the fly changes in configuration and functionality of the device under test without disrupting the testing.

10. A reconfigurable circuit testing system comprising:

a bus for communicating data;

a microprocessor for processing information, the microprocessor coupled to the bus;

a programmable functional component coupled to the bus,

wherein the programmable functional component includes a plurality of functional blocks programmable to provide a plurality of functions and configurations; and

a memory for storing data including test harness instructions for directing dynamic time multiplexed testing reconfiguration of the programmable functional component into the plurality of functions and configurations, and testing performance of the functions and characteristics.

11. The system of claim 10, wherein the testing is configured to determine a first one of the plurality of the functions and configurations that performs better than a second one of the plurality of the functions and configurations.

12. The system of claim 10, wherein the testing is configured to determine a first one of the plurality of the functions and configurations that performs worse than a second one of the plurality of the functions and configurations.

13. The system of claim 10, wherein the bus comprises a programmable interconnect for coupling components to the bus, and

wherein the test harness instructions cause changes in input/output values that dynamically change the programmable interconnect.

14. The system of claim 10, wherein data sheet information is fed back into the test harness instructions for assisting in selection of optimal functions and configurations.

15. The system of claim 10, further comprising:

a testing computer for directing test activities; and

a testing environment component for adjusting testing environment factors and for interfacing between the device under test and the testing computer.

16. The system of claim 10, wherein the test harness instructions take over control of operations of the programmable function components and prevent other programs from interacting with the programmable function component while reconfiguration is being implemented.

17. A reconfigurable component testing method comprising:

directing testing configuration of a device under test to a first configuration with a first value for a component parameter;

issuing a test harness command while the first value is set;

retrieving a first test result from the device under test while the first value is set;

directing testing configuration of the device under test to the first configuration with a second value for the component parameter;

issuing a test harness command while the second value is set; and

retrieving a second test result from the device under test while the second value is set.

18. The method of claim 17, further comprising comparing the first test result with the second test result.

19. The method of claim 17, wherein the component parameter comprises capacitance, the first value comprises a first capacitance value, and the second value comprises a second capacitance value.

20. The method of claim 17, wherein the component parameter comprises resistance, the first value comprises a first resistance value, and the second value comprises a second resistance value.