Optical projector with beam monitor including mapping apparatus capturing image of pattern projected onto an object
First Claim
Patent Images
1. Mapping apparatus, comprising:
- a projection subassembly, comprising;
a device package;
a radiation source, contained in the package and configured to emit a beam of coherent radiation;
a diffractive optical element (DOE), mounted in the package so as to receive and diffract the radiation from the radiation source into a predefined pattern comprising multiple diffraction orders; and
an optical detector, which is positioned in the package so as to receive a selected diffraction order of the DOE and to output a signal that is response to an intensity of the selected diffraction order;
an imaging subassembly, which is configured to capture an image of the pattern that is projected onto an object; and
processing circuitry, which is configured to process the image in order to produce a three-dimensional (3D) map of the object, and to process the signal in order to monitor a performance of the DOE.
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Abstract
Optical apparatus includes a device package, with a radiation source contained in the package and configured to emit a beam of coherent radiation. A diffractive optical element (DOE) is mounted in the package so as to receive and diffract the radiation from the radiation source into a predefined pattern comprising multiple diffraction orders. An optical detector is positioned in the package so as to receive and sense an intensity of a selected diffraction order of the DOE.
60 Citations
9 Claims
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1. Mapping apparatus, comprising:
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a projection subassembly, comprising; a device package; a radiation source, contained in the package and configured to emit a beam of coherent radiation; a diffractive optical element (DOE), mounted in the package so as to receive and diffract the radiation from the radiation source into a predefined pattern comprising multiple diffraction orders; and an optical detector, which is positioned in the package so as to receive a selected diffraction order of the DOE and to output a signal that is response to an intensity of the selected diffraction order; an imaging subassembly, which is configured to capture an image of the pattern that is projected onto an object; and processing circuitry, which is configured to process the image in order to produce a three-dimensional (3D) map of the object, and to process the signal in order to monitor a performance of the DOE. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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Specification