Probe circuit, multi-probe circuit, test apparatus, and electric device
First Claim
1. A probe circuit provided in an electronic device that includes a circuit which is under test and outputs a response signal corresponding to an input signal in synchronization with an operation clock, comprising:
- a sampling clock supplying section that outputs a sampling clock having a predetermined frequency;
a sampling section that outputs, outside the electronic device, a probe output signal of which frequency is lower than a frequency of the response signal and which corresponds to a sampling result obtained by sampling the response signal using the sampling clock; and
an edge-timing detecting section that detects edge timing at which logical value of the probe output signal changes,wherein the response signal has a prescribed signal pattern repeated with a predetermined recurrence period, andthe sampling clock supplying section outputs the sampling clock of which relative phase with respect in the signal pattern sequentially changes in each recurrence period.
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Accused Products
Abstract
A probe circuit is provided in an electronic device that includes a circuit which is under test and outputs a response signal corresponding to an input signal in synchronization with an operation clock. The probe circuit includes a sampling clock supplying section that outputs a sampling clock having a predetermined frequency, and a sampling section that outputs, outside the electronic device, a probe output signal of which frequency is lower than a frequency of the response signal and which corresponds to a sampling result obtained by sampling the response signal using the sampling clock. The response signal has a prescribed signal pattern repeated with a predetermined recurrence period, and the sampling clock supplying section outputs the sampling clock of which relative phase with respect to the signal pattern sequentially changes in each recurrence period.
6 Citations
19 Claims
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1. A probe circuit provided in an electronic device that includes a circuit which is under test and outputs a response signal corresponding to an input signal in synchronization with an operation clock, comprising:
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a sampling clock supplying section that outputs a sampling clock having a predetermined frequency; a sampling section that outputs, outside the electronic device, a probe output signal of which frequency is lower than a frequency of the response signal and which corresponds to a sampling result obtained by sampling the response signal using the sampling clock; and an edge-timing detecting section that detects edge timing at which logical value of the probe output signal changes, wherein the response signal has a prescribed signal pattern repeated with a predetermined recurrence period, and the sampling clock supplying section outputs the sampling clock of which relative phase with respect in the signal pattern sequentially changes in each recurrence period. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
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16. A test apparatus that tests an electronic device including a probe circuit and a circuit under test that outputs a response signal corresponding to an input signal in synchronization with an operation clock, the probe circuit including a sampling clock supplying section that outputs a sampling clock having a predetermined frequency, a sampling section that outputs, outside the electronic device, a probe output signal of which frequency is lower than as frequency of the response signal and which corresponds to a sampling result obtained by sampling the response signal using the sampling clock, and an input signal sampling section that generates a probe input signal by sampling the input signal using the sampling clock and outputs the probe input signal outside the electronic device, wherein the response signal has a prescribed signal pattern repeated with a predetermined recurrence period, and the sampling clock supplying section outputs the sampling clock of which relative phase with respect to the signal pattern sequentially changes in each recurrence period, the test apparatus comprising:
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an operation-clock generating section that supplies the operation clock to the circuit under test; a reference-clock generating section that generates a reference clock for the sampling clock based on the operation clock, the reference-clock generating section supplying the generated operation clock to the sampling clock supplying section; and a timing difference measuring section that measures a timing difference between an edge timing of the probe output signal and an edge timing of the probe input signal based en the probe output signal and the probe input signal. - View Dependent Claims (17, 18)
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19. An electronic device, comprising:
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a circuit that is under test and outputs a response signal corresponding to an input signal in synchronization with an operation clock; and a probe circuit that includes; sampling clock supplying section that outputs a sampling dock having a predetermined frequency; a sampling section that outputs, outside the electronic device, a probe output signal of which frequency is lower than a frequency of the response signal and which corresponds to a sampling result obtained by sampling the response signal using the sampling clock; and an edge-tinting detecting section that detects edge timing at which a logical value of the probe output signal changes, wherein the response signal has a prescribed signal pattern repeated with a predetermined recurrence period, and the sampling clock supplying section outputs the sampling clock of which relative phase with respect to the signal pattern sequentially changes in each recurrence period.
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Specification