Uniformity control for IC passivation structure
First Claim
1. A semiconductor device, comprising:
- a wafer containing an interconnect structure, the interconnect structure including a plurality of vias and interconnect lines;
a first conductive pad disposed over the interconnect structure, the first conductive pad being electrically coupled to the interconnect structure;
a plurality of second conductive pads disposed over the interconnect structure;
passivation layer disposed over and at least partially sealing the first and second conductive pads;
a conductive terminal that is electrically coupled to the first conductive pad but is not electrically coupled to the second conductive pads; and
a first post-passivation interconnect (PPI) device disposed over the passivation layer, wherein the first PPI device is electrically coupled to the first conductive pad, and wherein the first PPI device is electrically coupled to the conductive terminal.
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Accused Products
Abstract
The present disclosure involves a semiconductor device. The semiconductor device includes a wafer containing an interconnect structure. The interconnect structure includes a plurality of vias and interconnect lines. The semiconductor device includes a first conductive pad disposed over the interconnect structure. The first conductive pad is electrically coupled to the interconnect structure. The semiconductor device includes a plurality of second conductive pads disposed over the interconnect structure. The semiconductor device includes a passivation layer disposed over and at least partially sealing the first and second conductive pads. The semiconductor device includes a conductive terminal that is electrically coupled to the first conductive pad but is not electrically coupled to the second conductive pads.
18 Citations
20 Claims
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1. A semiconductor device, comprising:
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a wafer containing an interconnect structure, the interconnect structure including a plurality of vias and interconnect lines; a first conductive pad disposed over the interconnect structure, the first conductive pad being electrically coupled to the interconnect structure; a plurality of second conductive pads disposed over the interconnect structure; passivation layer disposed over and at least partially sealing the first and second conductive pads; a conductive terminal that is electrically coupled to the first conductive pad but is not electrically coupled to the second conductive pads; and a first post-passivation interconnect (PPI) device disposed over the passivation layer, wherein the first PPI device is electrically coupled to the first conductive pad, and wherein the first PPI device is electrically coupled to the conductive terminal. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A semiconductor device, comprising:
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a plurality of functional conductive pads and a plurality of dummy conductive, pads formed over a substrate; a passivation layer formed over the functional conductive pads and the dummy conductive pads, the passivation layer at least partially sealing the functional conductive pads and the dummy conductive pads; a plurality of functional post-passivation interconnect (PPI) devices formed over the passivation layer, wherein each functional PPI devices is electrically coupled to a respective one of the functional conductive pads; a plurality of dummy PPI devices formed over the passivation layer, wherein the dummy PPI devices are free of electrical coupling to the functional conductive pads; a polymer layer fanned over the functional PPI devices and the dummy PPI devices; and a plurality of conductive terminals formed over the polymer layer, wherein each of the conductive terminals is electrically coupled to at least one of the functional PPI devices, but the conductive terminals are free of electrical coupling to the dummy PPI devices. - View Dependent Claims (10, 11, 12, 13)
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14. A method, comprising:
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forming a plurality of functional conductive pads and a plurality of dummy conductive pads over a wafer that contains an interconnect structure, wherein the functional conductive pads and the dummy conductive pads are formed over the interconnect structure; forming a passivation layer over the functional conductive pads and the dummy conductive pads, the passivation layer at least partially sealing the functional conductive pads and the dummy conductive pads; and forming a plurality of conductive terminals over the passivation layer, the conductive, terminals each being electrically coupled to at least one of the functional conductive pads but being free of electrical coupling to the dummy conductive pads; and forming a pluralitv of functional post-passivation interconnect (PPI) devices, wherein the functional PPI devices are each electrically coupled to a respective one of the conductive terminals. - View Dependent Claims (15, 16, 17, 18, 19, 20)
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Specification