Semiconductor integrated circuit deciding a power-supply voltage based on a delay test
First Claim
1. A semiconductor integrated circuit, comprising:
- a voltage regulator providing a prescribed power-supply voltage;
a plurality of delay test circuits, each of the delay test circuits being configured in each of areas where electrical current flows in response to each of operation modes;
a test control unit executing a delay test using the delay test circuit under a test mode while decreasing the power-supply voltage in a stepwise fashion;
a supply voltage decision unit deciding the power-supply voltage of the operation mode on a basis of the delay test;
a memory unit storing the power-supply voltage of each operation mode;
a supply voltage configuration unit reading out the power-supply voltage corresponding to the operation mode from the memory unit, and the supply configuration unit arranging the power-supply voltage as an output voltage of the voltage regulator when each of the operation modes starts to execute.
1 Assignment
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Accused Products
Abstract
According to one embodiment, a semiconductor integrated circuit includes a semiconductor integrated circuit a voltage regulator providing a prescribed power-supply voltage, a plurality of delay test circuits, each of the delay test circuits being configured in each of areas where electrical current flows in response to each of operation modes, a test control unit executing a delay test using the delay test circuit under a test mode while decreasing a power-supply voltage in a stepwise fashion, a supply voltage decision unit deciding the power-supply voltage of the operation mode on a basis of the delay test, a memory unit storing the power-supply voltage of each operation mode, a supply voltage configuration unit reading out the power-supply voltage corresponding to the operation mode from the memory unit, and the supply configuration unit arranging the power-supply voltage as an output voltage of the voltage regulator when each of the operation modes starts to execute.
8 Citations
12 Claims
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1. A semiconductor integrated circuit, comprising:
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a voltage regulator providing a prescribed power-supply voltage; a plurality of delay test circuits, each of the delay test circuits being configured in each of areas where electrical current flows in response to each of operation modes; a test control unit executing a delay test using the delay test circuit under a test mode while decreasing the power-supply voltage in a stepwise fashion; a supply voltage decision unit deciding the power-supply voltage of the operation mode on a basis of the delay test; a memory unit storing the power-supply voltage of each operation mode; a supply voltage configuration unit reading out the power-supply voltage corresponding to the operation mode from the memory unit, and the supply configuration unit arranging the power-supply voltage as an output voltage of the voltage regulator when each of the operation modes starts to execute. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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Specification