Automated detection of and compensation for guardband degradation during operation of clocked data processing circuit

• US 8,631,290 B2
• Filed: 12/15/2011
• Issued: 01/14/2014
• Est. Priority Date: 12/16/2010
• Status: Active Grant

• Current Assignee: University of Southern California
• Original Assignee: University of Southern California
• Inventors: Annavaram, Murali, Zandian, Bardia
• Primary Examiner(s): Alphonse, Fritz
• Application Number:
  US13/327,561
• Publication Number:
  US 20120159276A1
• Time in Patent Office: 761 Days
• Field of Search: 714/731, 714/724, 714/738, 714/797, 714/726, 714/764, 714/11, 714/12, 714/15
• US Class Current: 714/731
• CPC Class Codes: G01R 31/3016 Delay or race condition test, e.g. race hazard test

Abstract

An automated guardband compensation system automatically compensates for degradation in the guardband of a clocked data processing circuit while that circuit is connected within a data processing system. A control circuit automatically and repeatedly requests: a switching circuit to switch a critical path within the clocked data processing circuit out of a data processing pathway within the data processing system while the clocked data processing circuit is connected within the data processing system; a guardband test circuit to test the guardband of the critical path while the critical path is switched out of the data processing pathway; a guardband compensation circuit to increase the guardband when the results of the test indicate a material degradation in the guardband; and a switching circuit to switch the critical path back into the data processing pathway after the test.

Claims

1. An automated guardband compensation system for automatically compensating for degradation in the guardband of a clocked data processing circuit while that circuit is connected within a data processing system comprising:

a switching circuit configured when requested to switch a critical path in the clocked data processing circuit out of and back into a data processing pathway in the data processing system while the clocked data processing circuit is connected within the data processing system;

a guardband test circuit configured when requested to test for degradation in the guardband of the critical path while the critical path is switched out of the data processing pathway;

a guardband compensation circuit configured when requested to increase the guardband; and

a control circuit configured to automatically and repeatedly request;

the switching circuit to switch the critical path out of the data processing pathway while the clocked data processing circuit is connected within the data processing system;

the guardband test circuit to test the guardband of the critical path while the critical path is switched out of the data processing pathway;

the guardband compensation circuit to increase the guardband when the results of the test indicate a material degradation in the guardband; and

the switching circuit to switch the critical path back into the data processing pathway after the test.

2. The automated guardband compensation system of claim 1 wherein:

the clocked data processing circuit is operated within the data processing system at a normal clock frequency; and

the guardband test circuit is configured to test for degradation in the guardband by testing the critical path at multiple, different test clock frequencies, each higher than the normal clock frequency.

3. The automated guardband compensation system of claim 2 wherein the guardband test circuit is configured to test for degradation in the guardband by detecting whether the clocked data processing circuit fails to function properly at any of the test clock frequencies.

4. The automated guardband compensation system of claim 1:

further comprising a test vector storage system containing multiple test vectors, each configured to test a different critical path in the clocked data processing circuit while that circuit is connected within the data processing system; and

wherein the guardband test circuit is configured to use the test vectors to test different critical paths in the clocked data processing circuit for degradation in the guardband of each tested critical path.

5. The automated guardband compensation system of claim 4 wherein:

a result is stored in the test vector storage system for each test vector that is indicative of how the critical path that is associated with the test vector should function in response to the test; and

the guardband test circuit is configured to test each critical path by determining whether the result that it produces in response to the test vector that tests it is consisted with the corresponding result stored in the test vector storage system.

6. The automated guardband compensation system of claim 5 wherein:

the test vector storage system is configured to store at least one test vector that is configured to test a non-critical path in the clocked data processing circuit while that circuit is connected within the data processing system; and

the guardband test circuit is configured when requested to test for degradation in the guardband of the at least one non-critical path while the non-critical path is switched out of a data processing pathway.

7. The automated guardband compensation system of claim 4 wherein the test vectors are selected based on the degree to which their associated critical paths are used during normal operation of the data processing system.

8. The automated guardband compensation system of claim 1 wherein:

the clocked data processing circuit is operated within the data processing system at a clock frequency; and

the guardband compensation circuit is configured to increase the guardband by decreasing the clock frequency.

9. The automated guardband compensation system of claim 1 wherein:

the clocked data processing circuit is operated within the data processing system at an operating voltage; and

the guardband test compensation is configured to increase the guardband by increasing the operating voltage.

10. The automated guardband compensation system of claim 1 wherein the guardband test compensation is configured to increase the guardband by switching in a replica of at least a portion of the clocked data processing circuit in place of at least that portion of the clocked data processing circuit.

11. The automated guardband compensation system of claim 1 wherein the critical path does not contain any data storage element, other than at the beginning or end of the path.

12. The automated guardband compensation system of claim 1 wherein the control circuit is configured to make the requests to the switching circuit and to the guardband test circuit periodically.

13. The automated guardband compensation system of claim 1 wherein the control circuit is configured to make the repeated requests to the switching circuit and to the guardband test circuit during idle periods of the clocked data processing circuit.

14. The automated guardband compensation system of claim 1 wherein the control circuit is configured to alter the frequency of the repeated requests based on one or more operating conditions of the clocked data processing circuit.

15. The automated guardband compensation system of claim 1 further comprising a test result storage system configured to store the results of the tests.

16. The automated guardband compensation system of claim 1 wherein the control circuit is configured to alter the frequency of the repeated requests based on the results of the tests that are stored in the test results storage system.

17. The automated guardband compensation system of claim 1 wherein the automated guardband compensation system and the clocked data processing circuit are within a common integrated circuit.

18. A automated guardband compensation system for automatically compensating for degradation in the guardband of a clocked data processing circuit while that circuit is connected within a data processing system comprising:

a test vector storage system containing multiple test vectors, each configured to test a different critical path in the clocked data processing circuit while that circuit is connected within the data processing system;

a guardband test circuit configured when requested to test for degradation in the guardband of a specified critical path in the clocked data processing circuit while that clocked data processing circuit is connected within the data processing system;

a guardband compensation circuit configured when requested to increase the guardband; and

a control circuit configured to automatically and repeatedly request;

the guardband test circuit to test the guardband of more than one of the critical paths using the test vectors for those critical paths while the clocked data processing circuit is connected within the data processing system; and

the guardband compensation circuit to increase the guardband when the results of a test indicate a material degradation in the guardband.

19. The automated guardband compensation system of claim 18 wherein:

a result is stored in the test vector storage system for each test vector that is indicative of how the critical path that is associated with the test vector should function in response to the test vector; and

the guardband test circuit is configured to test each critical path by determining whether the result that it produces in response to the test vector that tests it is consisted with the corresponding result stored in the test vector storage system.

20. The automated guardband compensation system of claim 19 wherein:

the test vector storage system is configured to store at least one test vector that is configured to test a non-critical path in the clocked data processing circuit while that circuit is connected within the data processing system; and

the guardband test circuit is configured when requested to test for degradation in the guardband of the at least one non-critical path while the non-critical path is switched out of a data processing pathway.

21. The automated guardband compensation system of claim 20 wherein the test vectors are selected based on the degree to which their associated critical paths are used during normal operation of the data processing system.

22. The automated guardband compensation system of claim 18 wherein the automated guardband compensation system and the clocked data processing circuit are within a common integrated circuit.