Advance manufacturing monitoring and diagnostic tool
First Claim
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1. A device comprising:
- an antenna,a receiver, configured, in combination with said antenna, to receive at least one emission of an electromagnetic energy, said at least one emission being given off by at least one electrical device;
at least one processor;
wherein said device is configured to monitor the at least one electrical device by measuring and processing a change or changes in a signature of said at least one electromagnetic emission; and
wherein said device is configured to predict degradation of a component of the at least one electrical device based on said signature change or changes.
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Abstract
The current invention relates to a monitoring and analysis device and a method for monitoring and analysis that utilizes the unintended electromagnetic emissions of electrically powered systems. The present invention monitors electrical devices by taking detailed measurements of the electromagnetic fields emitted by any component or system utilizing electricity. The measurements will be analyzed to both record a baseline score for future measurements and to be used in detailed analysis to determine the status of the analyzed system or component.
151 Citations
13 Claims
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1. A device comprising:
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an antenna, a receiver, configured, in combination with said antenna, to receive at least one emission of an electromagnetic energy, said at least one emission being given off by at least one electrical device; at least one processor; wherein said device is configured to monitor the at least one electrical device by measuring and processing a change or changes in a signature of said at least one electromagnetic emission; and wherein said device is configured to predict degradation of a component of the at least one electrical device based on said signature change or changes. - View Dependent Claims (6, 7, 8, 9, 10, 11)
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2. A device comprising:
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an antenna, a receiver, configured, in combination with said antenna, to receive at least one emission of an electromagnetic energy, said at least one emission being given off by at least one electrical device; at least one processor; wherein said device is configured to monitor the at least one electrical device by measuring and processing a change or changes in a signature of said at least one electromagnetic emission; and wherein the electromagnetic emission measurement device is configured, based on said signature changes, to predict degradation of the at least one electrical device.
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3. A comprising:
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an antenna, a receiver, configured, in combination with said antenna, to receive at least one unintended emission of an electromagnetic energy, said at least one unintended emission being given off by at least one semiconductor device; at least one processor; wherein said device is configured to passively measure and process a change or changes in a signature of said at least one unintended electromagnetic emission and is further configured to assess at least one of a health, defects, inconsistency and degradation of the at least one semiconductor device either during manufacturing of the at least one semiconductor device, during manufacturing of an assembly containing the at least one semiconductor device or during a quality control inspection. - View Dependent Claims (12, 13)
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4. A comprising:
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(a) an antenna, (b) a receiver, configured, in combination with said antenna, to receive at least one emission of an electromagnetic energy, said at least one emission being given off by at least one electrical device without an aid from a hardwire connection, (c) at least one processor, wherein said device is configured to measure and process change or changes in a signature of said at least one electromagnetic emission and is further configured to monitor a level of degradation of the at least one electrical device.
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5. A device comprising:
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a housing sized to be held by a hand of a user; an antenna disposed within said housing, a receiver disposed within said housing, said receiver configured, in combination with said antenna, to receive at least one emission of an electromagnetic energy, said at least one emission being given off by at least one electrical device, at least one processor disposed within said housing, and wherein said device is configured to measure and process change or changes in a signature of said at least one electromagnetic emission.
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Specification