System and method for configuring semiconductor functional circuits

• US 8,788,996 B2
• Filed: 12/18/2003
• Issued: 07/22/2014
• Est. Priority Date: 09/15/2003
• Status: Active Grant

• Current Assignee: NVIDIA Corporation
• Original Assignee: NVIDIA Corporation
• Inventors: Diamond, Michael B., Montrym, John S., Van Dyke, James M., Nagy, Michael B., Treichler, Sean J.
• Primary Examiner(s): LIN, SUN J
• Application Number:
  US10/740,722
• Publication Number:
  US 20050251761A1
• Time in Patent Office: 3,869 Days
• Field of Search: 716/17, 716/16, 716/1, 716/4, 716/100, 716/116, 716/117, 716/128, 716/136
• US Class Current: 716/117
• CPC Class Codes: G01R 31/31704 Design for test; Design verification concerning scan tests G01R31/318583; computer-aided design G06F30/00
• CPC Class Codes: G01R 31/3185 Reconfiguring for testing, e.g. LSSD, partitioning
• CPC Class Codes: G01R 31/318544 Scanning methods, algorithms and patterns G01R31/3183 takes precedence
• CPC Class Codes: G05B 99/00 Subject matter not provided for in other groups of this subclass
• CPC Class Codes: G06F 11/2289 by configuration test
• CPC Class Codes: G06F 11/267 Reconfiguring circuits for testing, e.g. LSSD, partitioning
• CPC Class Codes: G16Z 99/00 Subject matter not provided for in other main groups of this subclass
• CPC Class Codes: H01L 22/22 Connection or disconnection of sub-entities or redundant parts of a device in response to a measurement testing and repair of stores after manufacture including at wafer scale G11C29/00; fuses per se H01L23/525
• CPC Class Codes: H01L 2924/00 Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
• CPC Class Codes: H01L 2924/0002 Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Abstract

The present invention systems and methods enable configuration of functional components in integrated circuits. A present invention system and method can flexibly change the operational characteristics of functional components in an integrated circuit die based upon a variety of factors. In one embodiment, manufacturing yields, compatibility characteristics, performance requirements, and system health (e.g., the number of components operating properly) are factored into changes to the operational characteristics of functional components. In one exemplary implementation, the changes to operational characteristics of a functional component are coordinated with changes to other functional components. Workflow scheduling and distribution is also adjusted based upon the changes to the operational characteristics of the functional components. For example, a functional component configuration controller changes the operational characteristics settings and provides an indication to a workflow distribution component. The workflow distribution component changes the workflow schedule based upon the operational characteristics settings (e.g., work flow is diverted to or away from functional components).

Claims

1. An integrated circuit comprising:

a plurality of functional components for performing processing operations, wherein said plurality of functional components are included in a graphics processor;

a distribution component for distributing information to said plurality of functional components; and

a functional component configuration controller for configuring operational characteristics of one or more of said plurality of functional components.

2. The integrated circuit of claim 1 wherein said functional component configuration controller provides information to said distribution component regarding said operational characteristics of said plurality of functional components.

3. The integrated circuit of claim 1 wherein said distribution component factors said configured operational characteristics into distribution of said information to said plurality of functional components.

4. The integrated circuit of claim 1 wherein said functional component configuration controller configures said operational characteristics in accordance with a variety of operational objectives.

5. The integrated circuit of claim 1 further comprising a mask array wherein each mask included in said mask array corresponds to an operational objective and provides an indication of said operational characteristics of said plurality of functional components.

6. The integrated circuit of claim 5 wherein said mask array includes a yield mask for providing an indication of disablement of said defective functional components.

7. The integrated circuit of claim 6 wherein said mask array further comprises:

a compatibility mask for indicating enablement of compatible supported operational characteristics of said plurality of functional components;

a performance mask for indicating performance levels for said plurality of functional components; and

a self healing mask for indicating operational characteristics for said plurality of functional components based upon field testing.

8. The integrated circuit of claim 1 wherein said plurality of functional components include a pipeline.

9. A functional component configuration process comprising:

receiving an indication of a functional component configuration alteration trigger event;

determining if said indication of said functional component configuration alteration trigger event is valid;

directing alteration of a functional component configuration utilizing a processor; and

diverting workflow in accordance with said alteration of said functional component configuration.

10. The functional component configuration process of claim 9 further comprising checking an indication of functional component operational characteristics.

11. The functional component configuration process of claim 9 wherein configuring of a functional component is accomplished by programming a value that controls enablement of said functional component.

12. The functional component configuration process of claim 9 wherein configuring of a functional component is accomplished by programming a register that controls a clock speed of said functional component.

13. The functional component configuration process of claim 9 further comprising dispensing workflow to a plurality of functional components based upon operational characteristics.

14. The functional component configuration process of claim 9 further comprising preventing distribution of workflow to a functional component if said functional component is disabled.

15. The functional component configuration process of claim 9 further comprising determining operational characteristics that includes consideration and coordination of various operational objectives.

16. An integrated circuit comprising:

a plurality of functional components for performing similar parallel operations;

a functional component controller for controlling enablement and disablement of one or more of said plurality of functional components; and

a distribution component for distributing information to enabled functional components included in said plurality of functional components and preventing distribution of information to disabled functional components included in said plurality of functional components.

17. The integrated circuit of claim 16 wherein said functional component controller provides information to said distribution component regarding which of said plurality of functional components is disabled.

18. The integrated circuit of claim 16 wherein said functional component controller provides information to said distribution component regarding which of said plurality of functional components is enabled.

19. The integrated circuit of claim 16 wherein said plurality of functional components include active functional components.

20. The integrated circuit of claim 16 wherein said distribution component distributes workflow information.

21. The integrated circuit of claim 16 wherein said functional component controller comprises a software programmable register.

22. The integrated circuit of claim 16 wherein said functional component controller comprises a hardcoded mask.

23. The integrated circuit of claim 16 wherein said integrated circuit is marked with a performance indicator that corresponds to a number of said plurality of functional components that are disabled.

24. The integrated circuit of claim 16 wherein said integrated circuit is marked with a performance indicator that corresponds to a number of said plurality of functional components that are enabled.

25. An integrated circuit comprising:

a plurality of functional components for performing processing operations;

a distribution component for distributing information to said plurality of functional components;

a functional component configuration controller for configuring operational characteristics of one or more of said plurality of functional components; and

a mask array wherein each mask included in said mask array corresponds to an operational objective and provides an indication of said operational characteristics of said plurality of functional components.

26. The integrated circuit of claim 25 wherein said functional component configuration controller provides information to said distribution component regarding said operational characteristics of said plurality of functional components.

27. The integrated circuit of claim 25 wherein said distribution component factors said configured operational characteristics into distribution of said information to said plurality of functional components.

28. The integrated circuit of claim 25 wherein said functional component configuration controller configures said operational characteristics in accordance with a variety of operational objectives.

29. The integrated circuit of claim 25 wherein said mask array includes a yield mask for providing an indication of disablement of defective functional components.

30. The integrated circuit of claim 29 wherein said mask array further comprises:

a compatibility mask for indicating enablement of compatible supported operational characteristics of said plurality of functional components;

a performance mask for indicating performance levels for said plurality of functional components; and

a self healing mask for indicating operational characteristics for said plurality of functional components based upon field testing.

31. The integrated circuit of claim 25 wherein said plurality of functional components include a pipeline.