System and method for measuring an analyte in a sample
First Claim
1. A method of identifying a defect in a test strip, comprising:
- applying a first test voltage V1 for a first test time interval T1 between a first electrode and a second electrode sufficient to oxidize a reduced mediator at the second electrode;
applying a second test voltage V2 for a second test time interval T2 between a first electrode and a second electrode sufficient to oxidize a reduced mediator at the first electrode and in which the polarity of the first test voltage V1 is opposite the polarity of the second test voltage V2;
measuring a first test current i1 and a second test current i2 that occur during the second test time interval T2, the second test current i2 occurring after the first test current i1; and
determining whether the test strip has the defect using an equation based on the first test current i1 and the second test current i2.
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Accused Products
Abstract
Methods of determining a corrected analyte concentration in view of some error source are provided herein. The methods can be utilized for the determination of various analytes and/or various sources of error. In one example, the method can be configured to determine a corrected glucose concentration in view of an extreme level of hematocrit found within the sample. In other embodiments, methods are provided for identifying various system errors and/or defects. For example, such errors can include partial-fill or double-fill situations, high track resistance, and/or sample leakage. Systems are also provided for determining a corrected analyte concentration and/or detecting some system error.
185 Citations
31 Claims
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1. A method of identifying a defect in a test strip, comprising:
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applying a first test voltage V1 for a first test time interval T1 between a first electrode and a second electrode sufficient to oxidize a reduced mediator at the second electrode; applying a second test voltage V2 for a second test time interval T2 between a first electrode and a second electrode sufficient to oxidize a reduced mediator at the first electrode and in which the polarity of the first test voltage V1 is opposite the polarity of the second test voltage V2; measuring a first test current i1 and a second test current i2 that occur during the second test time interval T2, the second test current i2 occurring after the first test current i1; and determining whether the test strip has the defect using an equation based on the first test current i1 and the second test current i2. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
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17. A method of identifying a defect in a test strip comprising:
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applying a first test voltage V1 for a first test time interval T1 between a first electrode and a second electrode sufficient to oxidize a reduced mediator at the second electrode; applying a second test voltage V2 for a second test time interval between a first electrode and a second electrode sufficient to oxidize a reduced mediator at the first electrode; measuring a first test current i1, a second test current i2, a third test current i3, and a fourth test current i4 that occur during the second test time interval T2; calculating a first logarithm of a first ratio based on the first test current i1 and the second test current i2; calculating a second logarithm of a second ratio based on the third test current i3 and the fourth test current i4; and determining whether the test strip has a defect using an equation based on the first logarithm and the second logarithm. - View Dependent Claims (18, 19, 20, 21, 22, 23, 24, 25, 26)
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27. A method of identifying an error in performing a test with a test strip, comprising:
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applying a first test voltage V1 for a first test time interval T1 between a first electrode and a second electrode; measuring consecutively a first test current i1, a second test current i2, and a third test current i3; and determining whether an error was performed by using an equation based on the second test current i2 and a summation of the absolute value of the first test current i1 and the absolute value of the third test current i3. - View Dependent Claims (28, 29, 30, 31)
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Specification