×

Systems, methods, and apparatuses for monitoring weld quality

  • US 9,089,921 B2
  • Filed: 10/03/2013
  • Issued: 07/28/2015
  • Est. Priority Date: 11/13/2009
  • Status: Active Grant
First Claim
Patent Images

1. A system for training students learning a welding process, the system comprising a plurality of welding stations, each welding station operable to accommodate one student and including an electric arc welder with a monitor for monitoring the electric arc welder as the student uses the electric arc welder performing the welding process by creating actual welding parameters between an advancing wire and a workpiece to form a weld, said welding process being defined by a series of rapidly repeating wave shapes of command signals for said welding parameters, each wave shape constituting a weld cycle with a cycle time,wherein said monitor comprises:

  • logic for segmenting each of said wave shapes into a series of time segmented states;

    logic for selecting a specific wave shape state;

    logic for reading a selected weld parameter occurring in said specific wave shape state at an interrogation rate over a period of time repeated during the welding process to obtain a data set for said selected weld parameter;

    logic for calculating a quality value of at least one quality parameter for said selected weld parameter from said data set for each period of time;

    logic for comparing each quality value to an expected quality value to determine if a difference between said quality value and said expected quality value exceeds a predetermined threshold;

    logic for weighting said quality value with a magnitude weight based on said difference, and weighting said quality value with a time contribution weight based on a time contribution of said state to its wave shape, if said difference exceeds said threshold; and

    logic for determining a quality score for said weld based on all of said quality values, including any weighted quality values, obtained during said welding process.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×