Detection of one or more interstitial constituents in a polycrystalline diamond element using radiation

• US 9,116,094 B1
• Filed: 10/17/2014
• Issued: 08/25/2015
• Est. Priority Date: 10/20/2010
• Status: Expired due to Fees

• Current Assignee: US Synthetic Corporation (ChampionX Corporation)
• Original Assignee: US Synthetic Corporation (ChampionX Corporation)
• Inventors: Mukhopadhyay, Debkumar, Bertagnolli, Kenneth E.
• Primary Examiner(s): McDonough, James
• Application Number:
  US14/517,547
• Time in Patent Office: 312 Days
• Field of Search: 513/09, 512/93, 513/07, 513/08
• US Class Current: 1/1
• CPC Class Codes: B24D 18/0009 using moulds or presses
• CPC Class Codes: C04B 35/52 based on carbon, e.g. graphite
• CPC Class Codes: C04B 41/009 characterised by the material treated
• CPC Class Codes: C04B 41/5353 Wet etching, e.g. with etchants dissolved in organic solvents
• CPC Class Codes: C04B 41/91 involving the removal of part of the materials of the treated articles, e.g. etching
• CPC Class Codes: G01N 23/005 by using neutrons G01N23/02 - G01N23/227 take precedence
• CPC Class Codes: G01N 23/05 using neutrons
• CPC Class Codes: G01N 33/385 Crystals
• CPC Class Codes: G01N 33/40 Grinding-materials

Abstract

In an embodiment, a method of non-destructively testing a polycrystalline diamond (“PCD”) element includes providing a PCD element including a plurality of bonded diamond grains defining a plurality of interstitial regions, at least a portion of the plurality of interstitial regions including one or more interstitial constituents disposed therein. The method further includes exposing the PCD element to neutron radiation from a neutron radiation source, receiving a portion of the neutron radiation that passes through the PCD element, and determining at least one characteristic of the PCD element at least partially based on the portion of the neutron radiation received. For example, the at least one characteristic may be the presence and distribution of metal-solvent catalyst, residual metal-solvent catalyst, an infiltrant, residual infiltrant, or other interstitial constituents within a PCD element.

Claims

1. A method of non-destructively testing a polycrystalline diamond element, the method comprising:

providing the polycrystalline diamond element including a plurality of bonded diamond grains defining a plurality of interstitial regions, at least a portion of the plurality of interstitial regions including one or more interstitial constituents therein;

exposing the polycrystalline diamond element to radiation from a radiation source;

receiving a portion of the radiation from the polycrystalline diamond element; and

detecting at least one Group VIII metal and at least one chemical compound that does not include a Group VIII metal in the polycrystalline diamond element at least partially based on the portion of the radiation received.

2. The method of claim 1 wherein the polycrystalline diamond element is at least partially leached.

3. The method of claim 2 wherein detecting at least one Group VIII metal and at least one chemical compound that does not include a Group VIII metal at least partially based on the portion of the radiation received includes determining a location of an interface between a first region that extends inwardly from an exterior working surface of the at least partially leached polycrystalline diamond table and is substantially free of the at least one Group VIII metal and a second region of the at least partially leached polycrystalline diamond table that includes the at least one Group VIII metal.

4. The method of claim 2 wherein the one or more interstitial constituents include a one or more of at least one Group VIII metal, an infiltrant, a residual metal-solvent catalyst including a Group VIII metal, a residual infiltrant, one or more light chemical elements, one or more light chemical molecules, one or more salts, or one or more oxides.

5. The method of claim 2 wherein the at least partially leached polycrystalline diamond element is bonded to a substrate.

6. The method of claim 1 wherein detecting at least one Group VIII metal and at least one chemical compound that does not include a Group VIII metal in the polycrystalline diamond element at least partially based on the portion of the radiation received includes detecting at least one of a presence of clusters of the at least one Group VIII metal or the least one chemical compound that does not include a Group VIII metal disposed within a portion of the interstitial regions.

7. The method of claim 1 wherein detecting at least one Group VIII metal and at least one chemical compound that does not include a Group VIII metal in the polycrystalline diamond element at least partially based on the portion of the radiation received includes detecting a presence of one or more of light chemical elements or light chemical molecules within a portion of the interstitial regions.

8. The method of claim 7 wherein the one or more of light chemical elements or light chemical molecules include at least one of hydrogen, oxygen, nitrogen, or water.

9. The method of claim 1 wherein the radiation source includes a neutron radiation source, and wherein the radiation includes neutron radiation.

10. The method of claim 1 wherein the one or more interstitial constituents include one or more of at least one Group VIII metal, an infiltrant, one or more light chemical elements, one or more light chemical molecules, one or more salts, or one or more oxides.

11. The method of claim 1 wherein receiving a portion of the radiation from the polycrystalline diamond element includes receiving the portion of the radiation that passes through the polycrystalline diamond element.

12. The method of claim 1, further comprising modifying a manufacturing process used to fabricate the polycrystalline diamond element at least partially based on the detected at least one Group VIII metal or at least one chemical compound that does not include a Group VIII metal.

13. The method of claim 12 wherein modifying a manufacturing process used to fabricate the polycrystalline diamond element at least partially based on the detected at least one Group VIII metal or at least one chemical compound that does not include a Group VIII metal includes modifying at least one high-pressure/high-temperature process condition used to fabricate the polycrystalline diamond element.

14. The method of claim 12 wherein modifying a manufacturing process used to fabricate the polycrystalline diamond element at least partially based on the detected at least one Group VIII metal or at least one chemical compound that does not include a Group VIII metal includes modifying a leaching acid composition, leaching time, diamond particle size, or combinations thereof.

15. The method of claim 1, further comprising:

correlating the detected presence of the at least one Group VIII metal or at least one chemical compound that does not include a Group VIII metal in the polycrystalline diamond element to at least one performance characteristic of the polycrystalline diamond element; and

modifying a manufacturing process used to fabricate the polycrystalline diamond element at least partially based on the at least one performance characteristic.

16. A method of non-destructively testing a polycrystalline diamond element, the method comprising:

providing an at least partially leached polycrystalline diamond element including a plurality of bonded diamond grains defining a plurality of interstitial regions, at least a portion of the plurality of interstitial regions including one or more interstitial constituents disposed therein;

exposing the at least partially leached polycrystalline diamond element to radiation from a radiation source;

receiving a portion of the radiation that passes through the at least partially leached polycrystalline diamond element;

at least partially based on the portion of the radiation received, detecting at least one Group VIII metal and at least one chemical compound within a portion of the interstitial regions of the at least partially leached polycrystalline diamond element; and

correlating the detected at least one Group VIII metal or at least one chemical compound that does not include a Group VIII metal within the portion of the interstitial regions of the at least partially leached polycrystalline diamond element with at least one performance characteristic of the at least partially leached polycrystalline diamond element.

17. The method of claim 16, further comprising modifying a manufacturing process used to fabricate the at least partially leached polycrystalline diamond element at least partially based on the at least one performance characteristic.

18. The method of claim 16 wherein detecting at least one Group VIII metal and at least one chemical compound that does not include a Group VIII metal within a portion of the interstitial regions of the at least partially leached polycrystalline diamond element includes detecting at least one leaching by-product within a portion of the interstitial regions of the at least partially leached polycrystalline diamond element.

19. The method of claim 16 wherein the at least one chemical compound includes at least one of hydrogen, oxygen, nitrogen, water, salts, or oxides.

20. A method of non-destructively testing a polycrystalline diamond element, the method comprising:

providing an un-leached polycrystalline diamond element including a plurality of bonded diamond grains defining a plurality of interstitial regions, at least a portion of the plurality of interstitial regions including one or more interstitial constituents disposed therein;

exposing the un-leached polycrystalline diamond element to radiation from a radiation source;

receiving a portion of the radiation that passes through the un-leached polycrystalline diamond element;

at least partially based on the portion of the radiation received, detecting at least one Group VIII metal and at least one chemical compound that does not include a Group VIII metal within a portion of the interstitial regions of the un-leached polycrystalline diamond element.

21. The method of claim 20, wherein the un-leached polycrystalline diamond element is bonded to a substrate.

22. The method of claim 20, further comprising correlating the detected at least one Group VIII metal or at least one chemical compound that does not include a Group VIII metal within the portion of the interstitial regions of the un-leached polycrystalline diamond element with at least one performance characteristic of the un-leached polycrystalline diamond element.

23. The method of claim 22, further comprising modifying a manufacturing process used to fabricate the un-leached polycrystalline diamond element at least partially based on the at least one performance characteristic.