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Transaction correlation system

  • US 9,208,271 B1
  • Filed: 11/19/2010
  • Issued: 12/08/2015
  • Est. Priority Date: 11/19/2010
  • Status: Expired due to Fees
First Claim
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1. A method of automated debugging of a design verification environment, the method comprising:

  • identifying a plurality of attributes of the design verification environment;

    performing a plurality of simulation runs of the design verification environment;

    recording a plurality of samples for each of the plurality of attributes from the plurality of simulation runs, wherein each sample includes a plurality of values of the plurality of attributes;

    determining a subset of the simulation runs that fail;

    determining a subset of simulation runs that pass;

    identifying a subset of the plurality of attributes such that a distribution of values of the subset of attributes for the passing runs is different from a distribution of values of the subset of attributes for the failing runs;

    generating a log of the plurality of simulation runs;

    generating a tabular description based upon the log, wherein identifying the subset is based upon, at least in part, the tabular description;

    utilizing a plurality of flattened tables as an input to a transaction correlation algorithm to determine one or more bugs in the design verification environment;

    determining a measure for each passing run, wherein each measure for each passing run is based on a measure of the values sampled in the respective passing run;

    determining a measure for each failing run, wherein each measure for each failing run is based on a measure of the values sampled in the respective failing run;

    wherein the measure of the respective value sampled in the passing run is proportional to (A+C/D)/(B+1)−

    (C−

    C/D)/(D−

    1) and the measure of the respective value sampled in the failing runs is proportional to (A+1)/(B+1)−

    (C−

    1)/(D−

    1), wherein;

    A=the number of failing runs with the respective value;

    B=the number of failing runs;

    C=the number of passing runs with the respective value; and

    D=the number of passing runs.

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