In-vacuum high speed pre-chill and post-heat stations
First Claim
1. An ion implantation system, comprising:
- a process chamber having a process environment associated therewith that is substantially evacuated;
an ion implantation apparatus configured to provide a plurality of ions to a workpiece positioned in the process chamber;
a chuck configured to support the workpiece within the process chamber during an exposure of the workpiece to the plurality of ions, wherein the chuck is configured to cool the workpiece to a processing temperature;
a load lock chamber operably coupled to the process chamber, wherein the load lock chamber is configured to isolate the process environment from an external environment, and wherein the load lock chamber comprises a workpiece support configured to support the workpiece during a transfer of the workpiece between the process chamber and external environment; and
a pre-chill station positioned within the process chamber, wherein the pre-chill station comprises a chilled workpiece support that is separate from the chuck and is configured to cool the workpiece to a first temperature;
a chilled workpiece holding station positioned within the process chamber, wherein the chilled workpiece holding station comprises a cold workpiece support configured to receive and support the workpiece transferred thereto from the pre-chill station, and wherein the cold workpiece support is further configured to maintain the first temperature of the workpiece while the workpiece resides thereon;
a post-heat station positioned within the process chamber and in continuous fluid communication with the process environment, wherein the post-heat station comprises a heated workpiece support configured to heat the workpiece to a second temperature;
a heated workpiece holding station positioned within the process chamber, wherein the heated workpiece holding station comprises a hot workpiece support configured to receive and support the workpiece transferred thereto from the post-heat station, and wherein the hot workpiece support is further configured to maintain the second temperature of the workpiece while the workpiece resides thereon; and
a workpiece transfer arm, wherein the workpiece transfer arm is configured to concurrently transfer two or more workpieces between two or more of the chuck, load lock chamber, chilled workpiece holding station, heated workpiece holding station, pre-chill station, and post-heat station.
3 Assignments
0 Petitions
Accused Products
Abstract
An ion implantation system provides ions to a workpiece positioned in a vacuum environment of a process chamber on a cooled chuck. A pre-chill station within the process chamber has a chilled workpiece support configured to cool the workpiece to a first temperature, and a post-heat station within the process chamber, has a heated workpiece support configured to heat the workpiece to a second temperature. The first temperature is lower than a process temperature, and the second temperature is greater than an external temperature. A workpiece transfer arm is further configured to concurrently transfer two or more workpieces between two or more of the chuck, a load lock chamber, the pre-chill station, and the post-heat station.
14 Citations
24 Claims
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1. An ion implantation system, comprising:
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a process chamber having a process environment associated therewith that is substantially evacuated; an ion implantation apparatus configured to provide a plurality of ions to a workpiece positioned in the process chamber; a chuck configured to support the workpiece within the process chamber during an exposure of the workpiece to the plurality of ions, wherein the chuck is configured to cool the workpiece to a processing temperature; a load lock chamber operably coupled to the process chamber, wherein the load lock chamber is configured to isolate the process environment from an external environment, and wherein the load lock chamber comprises a workpiece support configured to support the workpiece during a transfer of the workpiece between the process chamber and external environment; and a pre-chill station positioned within the process chamber, wherein the pre-chill station comprises a chilled workpiece support that is separate from the chuck and is configured to cool the workpiece to a first temperature; a chilled workpiece holding station positioned within the process chamber, wherein the chilled workpiece holding station comprises a cold workpiece support configured to receive and support the workpiece transferred thereto from the pre-chill station, and wherein the cold workpiece support is further configured to maintain the first temperature of the workpiece while the workpiece resides thereon; a post-heat station positioned within the process chamber and in continuous fluid communication with the process environment, wherein the post-heat station comprises a heated workpiece support configured to heat the workpiece to a second temperature; a heated workpiece holding station positioned within the process chamber, wherein the heated workpiece holding station comprises a hot workpiece support configured to receive and support the workpiece transferred thereto from the post-heat station, and wherein the hot workpiece support is further configured to maintain the second temperature of the workpiece while the workpiece resides thereon; and a workpiece transfer arm, wherein the workpiece transfer arm is configured to concurrently transfer two or more workpieces between two or more of the chuck, load lock chamber, chilled workpiece holding station, heated workpiece holding station, pre-chill station, and post-heat station. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 24)
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17. A method for implanting ions into a workpiece at sub-ambient temperatures, the method comprising:
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providing a workpiece in an external environment at an external temperature and external pressure; providing a workpiece transfer arm comprising at least one pair of workpiece transfer clamps that are diametrically opposed to each other and configured to open and close in a scissor-like manner, therein being configured to selectively grip and release a periphery of two or more workpieces; transferring the workpiece from the external environment to a load lock chamber; lowering the pressure within the load lock chamber to a substantial vacuum; transferring the workpiece from the load lock chamber to pre-chill station within a vacuum environment of a process chamber in a cold implant ion implantation system via the workpiece transfer arm; cooling the workpiece at the pre-chill station, wherein the pre-chill station is cooled to a first temperature that is lower than a process temperature; transferring the workpiece from the pre-chill station to a cold workpiece support in a chilled workpiece holding station within the vacuum environment via the workpiece transfer arm; maintaining the first temperature of the workpiece via the cold workpiece support while the workpiece resides on the cold workpiece support; transferring the workpiece from the pre-chill chilled workpiece holding station to a chuck that is cooled to the process temperature within in the vacuum environment via the workpiece transfer arm; implanting ions into the workpiece; transferring the workpiece from the chuck to a post-heat station within the vacuum environment via the workpiece transfer arm; heating the workpiece at the post-heat station, wherein the post-heat station is heated to a second temperature that is greater than the external temperature; transferring the workpiece from the post-heat station to a hot workpiece support in a heated workpiece holding station within the vacuum environment via the workpiece transfer arm; maintaining the second temperature of the workpiece via the hot workpiece support while the workpiece resides on the hot workpiece support; transferring the workpiece from the post h at heated workpiece holding station to the load lock chamber via the workpiece transfer arm; increasing the pressure within the load lock chamber to the external pressure; and removing the workpiece from the load lock chamber. - View Dependent Claims (18, 19, 20, 21, 22, 23)
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Specification