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Accelerated life testing device and method

  • US 9,267,875 B2
  • Filed: 11/21/2013
  • Issued: 02/23/2016
  • Est. Priority Date: 11/21/2013
  • Status: Active Grant
First Claim
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1. An accelerated life testing method for a test piece within a test chamber, the method comprising:

  • establishing a first atmosphere within the test chamber;

    changing the first atmosphere to a second atmosphere to form a deposition layer on the test piece;

    changing the second atmosphere to the first atmosphere to remove the deposition layer from the test piece; and

    repeating the changing the first atmosphere to the second atmosphere and the changing the second atmosphere to the first atmosphere to form an oxidation layer on the test piece.

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