System and method for making concentration measurements within a sample material using orbital angular momentum

• US 9,267,877 B2
• Filed: 07/24/2014
• Issued: 02/23/2016
• Est. Priority Date: 03/12/2014
• Status: Active Grant

• Current Assignee: Nxgen Partners Ip, LLC (NxGen Partners LLC)
• Original Assignee: Nxgen Partners Ip, LLC (NxGen Partners LLC)
• Inventors: Ashrafi, Solyman, Linquist, Roger, Ashrafi, Nima
• Primary Examiner(s): Stock, Jr., Gordon J
• Application Number:
  US14/339,836
• Publication Number:
  US 20150260650A1
• Time in Patent Office: 579 Days
• Field of Search: None
• US Class Current: 1/1
• CPC Class Codes: G01N 21/17 Systems in which incident light is modified in accordance with the properties of the material investigated where the material investigated is optically excited causing a change in wavelength of the incident light G01N21/63
• CPC Class Codes: G01N 21/21 Polarisation-affecting properties G01N21/19 takes precedence
• CPC Class Codes: G01N 21/453 Holographic interferometry for dimensional measurements G01B9/021 - G01B9/029
• CPC Class Codes: G01N 21/59 Transmissivity G01N21/25 takes precedence
• CPC Class Codes: G01N 24/00 Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects
• CPC Class Codes: G01N 33/483 Physical analysis of biological material
• CPC Class Codes: G01N 33/50 Chemical analysis of biological material, e.g. blood, urine; Testing involving biospecific ligand binding methods; Immunological testing measuring or testing processes involving enzymes or microorganisms, compositions or test papers therefor; processes for forming such compositions, condition responsive control in microbiological or enzymological processes C12Q

Abstract

Signal generation circuitry generates a first signal having at least one orbital angular momentum applied thereto and applies the first signal to the sample. A detector for receives the first signal after it passes through the sample and determines the concentration of the material within the sample based on a detected value of orbital angular momentum with the first signal received from the sample.

Claims

1. An apparatus that measures a concentration of a material within a sample, comprising:

signal generation circuitry that generates a first signal having at least one orbital angular momentum applied thereto and applying the first signal to the sample;

a detector that receives the first signal after the first signal passes through the sample and that determines the concentration of the material within the sample based on a detected value of orbital angular momentum with the first signal received from the sample.

2. The apparatus of claim 1, wherein differing values of the concentration indicate different concentrations of the material within the sample.

3. The apparatus of claim 1, wherein the first signal comprises a light beam.

4. The apparatus of claim 1 further including amplifying circuitry that receives the first signal after the first signal passes through the sample and that amplifies a first portion of the first signal having the detected value of the orbital angular momentum associated therewith.

5. The apparatus of claim 1, wherein the detector further comprises:

an orbital angular momentum detector that determines the detected value of the orbital angular momentum within the first signal from the sample; and

a processor that determines the concentration of the material within the sample responsive to the detected value of the orbital angular momentum.

6. The apparatus of claim 1, wherein the signal generation circuitry further comprises:

an emitting source that emits the first signal comprising a plurality of plane waves;

orbital angular momentum generation circuitry that receives the first signal and that applies the at least one orbital angular momentum to the plane waves of the first signal.

7. The apparatus of claim 4, wherein the amplifying circuitry further includes a hologram that amplifies the orbital angular momentum associated with the concentration of the material in the sample.

8. The apparatus of claim 5 further including a user interface associated with the processor comprising:

a set of computer instructions that configures the processor to determine the concentration of the material within the sample responsive to the detected value of the orbital angular momentum;

a database that stores concentration data from concentrations determined by the processor.

9. The apparatus of claim 8, wherein the user interface further includes a wireless interface that communicates the concentration data to a remote location.

10. The apparatus of claim 6, wherein the orbital angular momentum generation circuitry comprises a fixed orbital angular momentum generation circuitry that applies a fixed orbital angular momentum to the first signal.

11. The apparatus of claim 6, wherein the orbital angular momentum generation circuitry comprises a tunable orbital angular momentum generation circuitry that applies a selected orbital angular momentum to the first signal responsive to at least one tuning parameter provided to the tunable orbital angular momentum generation circuitry.

12. The apparatus of claim 6, wherein the orbital angular momentum generation circuitry comprises:

at least one pi/2 mode converter that converts the first signal from Hermite-Guassian modes to Laguerre-Gaussian modes;

a converter that converts the first signal in the Laguerre-Gaussian modes to reversed Laguerre-Gaussian modes.

13. The apparatus of claim 6, wherein the orbital angular momentum generation circuitry further includes a hologram that applies the at least one orbital angular momentum to the plane waves of the first signal.

14. The apparatus of claim 13, wherein the hologram comprise a pair of superimposed holograms comprising a composite vortex grid.

15. An apparatus that measures a concentration of a material within a sample, comprising:

an emitting source that emits a first light beam comprising a plurality of plane waves;

orbital angular momentum generation circuitry that receives the first light beam and that applies at least one orbital angular momentum to the plurality of plane waves of the first light beam;

amplifying circuitry that receives the first light beam after the first light beam passes through the sample and that amplifies a first portion of the first light beam having a predetermined value of the orbital angular momentum associated therewith;

a detector that receives the first light beam after the first light beam passes through the sample and that determines the concentration of the material within the sample based on a detected value of orbital angular momentum within the amplified portion of the light beam having the predetermined value of the orbital angular momentum associated therewith.

16. The apparatus of claim 15, wherein the orbital angular momentum generation circuitry comprises a fixed orbital angular momentum generation circuitry that applies a fixed orbital angular momentum to the first light beam.

17. The apparatus of claim 15, wherein the orbital angular momentum generation circuitry comprises a tunable orbital angular momentum generation circuitry that applies a selected orbital angular momentum to the first light beam responsive to at least one tuning parameter provided to the tunable orbital angular momentum generation circuitry.

18. The apparatus of claim 15, wherein the orbital angular momentum generation circuitry comprises:

at least one pi/2 mode converter for converting the first light beam from Hermite-Guassian modes to Laguerre-Gaussian modes;

a converter for converting the first light beam in the Laguerre-Gaussian modes to reversed Laguerre-Gaussian modes.

19. The apparatus of claim 15, wherein differing values of the concentration indicate different concentrations of the material within the sample.

20. The apparatus of claim 15, wherein the orbital angular momentum generation circuitry further includes a hologram for applying the at least one orbital angular momentum to the plurality of plane waves of the first light beam.

21. The apparatus of claim 15 further comprising a processor that determines the concentration of the material within the sample responsive to the detected value of the orbital angular momentum.

22. The apparatus of claim 20, wherein the hologram comprises a pair of superimposed holograms comprising a composite vortex grid.

23. The apparatus of claim 21 further including a user interface associated with the processor comprising:

a set of computer instructions that configures the processor to determine the concentration of the material within the sample responsive to the detected value of the orbital angular momentum;

a database that stores concentration data from concentrations determined by the processor.

24. The apparatus of claim 23, wherein the user interface further includes a wireless interface that communicates the concentration data to a remote location.

25. A method for measuring a concentration of a material within a sample, comprising:

generating a first signal having at least one orbital angular momentum applied thereto;

applying the first signal to the sample;

receiving the first signal after the first signal passes through the sample;

detecting a value of the orbital angular momentum within the received first signal; and

determining the concentration of the material within the sample based on the detected value of orbital angular momentum with the first signal received from the sample.

26. The method of claim 25 further including:

receiving the first signal after the first signal passes through the sample; and

amplifying a first portion of the signal having the detected value of the orbital angular momentum associated therewith.

27. The method of claim 25 further including storing concentration data from concentrations that are determined.

28. The method of claim 25, wherein the step of generating further comprises:

emitting the first signal comprising a plurality of plane waves;

receiving the first signal; and

applying the at least one orbital angular momentum to the plane waves of the first signal.

29. The method of claim 28, wherein the step of applying further comprises applying a fixed orbital angular momentum to the first signal.

30. The method of claim 28, wherein the step of applying further comprises applying a selected orbital angular momentum to the first signal responsive to at least one tuning parameter provided to the tunable orbital angular momentum generation circuitry.