System and method for automatic orientation of a chip to the CAD layout with sub-optical resolution
First Claim
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1. A computerized method for orienting an image of an integrated circuit device under test (DUT) using a computing system, comprising:
- obtaining an optical image of the DUT from an optical system;
obtaining a computer aided design (CAD) data having a plurality of CAD layers of the DUT;
operating on each of the CAD layers to generate a synthetic image simulating an optical image of the CAD layer;
constructing a CAD image of the DUT by overlaying the synthetic images of the CAD layers;
generating a difference image by comparing the optical image to the synthetic image;
varying parameters of each CAD layer of the synthetic image so as to minimize the difference image by, for each of the plurality of CAD layers;
aligning each layer to the optical image in translation, rotation, and image magnification;
adjusting brightness, emissivity and transmittance values of each layer; and
,indicating edges of transparent layers.
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Abstract
A method and system for aligning a DUT image for testing. The alignment is performed by obtaining an optical image of the DUT from an optical system; obtaining a computer aided design (CAD) data having CAD layers of the DUT; constructing a CAD image of the DUT by overlaying the CAD layers; operating on the CAD image to generate a synthetic image simulating an optical image of the DUT; generating a difference image by comparing the optical image to the synthetic image; and, varying parameters of the synthetic image so as to minimize the difference image.
24 Citations
16 Claims
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1. A computerized method for orienting an image of an integrated circuit device under test (DUT) using a computing system, comprising:
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obtaining an optical image of the DUT from an optical system; obtaining a computer aided design (CAD) data having a plurality of CAD layers of the DUT; operating on each of the CAD layers to generate a synthetic image simulating an optical image of the CAD layer; constructing a CAD image of the DUT by overlaying the synthetic images of the CAD layers; generating a difference image by comparing the optical image to the synthetic image; varying parameters of each CAD layer of the synthetic image so as to minimize the difference image by, for each of the plurality of CAD layers; aligning each layer to the optical image in translation, rotation, and image magnification; adjusting brightness, emissivity and transmittance values of each layer; and
,indicating edges of transparent layers. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
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Specification