Semiconductor light emitting device
First Claim
1. A semiconductor light emitting device comprising:
- a metal layer being conductive;
a first semiconductor layer of a first conductivity type containing a GaN crystal and receiving tensile stress in a (0001) plane;
a second semiconductor layer of a second conductivity type, the second semiconductor layer being provided between the metal layer and the first semiconductor layer and containing a GaN crystal;
a reflecting metal provided between the metal layer and the second semiconductor layer, the reflecting metal having direct connection with the second semiconductor layer;
a light emitting layer provided between the first semiconductor layer and the second semiconductor layer, the light emitting layer containing a nitride semiconductor crystal; and
a third semiconductor layer provided between the second semiconductor layer and the light emitting layer and relaxing tensile stress applied from the metal layer to the second semiconductor layer, the third semiconductor layer containing AlGaN crystal,the metal layer having a thermal expansion coefficient larger than a thermal expansion coefficient of the nitride semiconductor crystal,the first semiconductor layer having a first face and a second face, the first face facing the light emitting layer, the second face being opposite to the first face, anda light emitted from the light emitting layer being extracted through the second face.
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Accused Products
Abstract
According to one embodiment, a semiconductor light emitting device includes: a first semiconductor layer of a first conductivity type; a second semiconductor layer of a second conductivity type; a light emitting layer; a conductive metal layer; and a first stress application layer. The first semiconductor layer contains a nitride semiconductor crystal and receives tensile stress in a (0001) plane. The second semiconductor layer contains a nitride semiconductor crystal. The light emitting layer has an average lattice constant larger than a lattice constant of the first semiconductor layer. The conductive metal layer has a thermal expansion coefficient larger than a thermal expansion coefficient of a nitride semiconductor crystal. The first stress application layer is provided between the second semiconductor layer and the light emitting layer. The first stress application layer relaxes tensile stress applied from the metal layer to the second semiconductor layer.
17 Citations
26 Claims
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1. A semiconductor light emitting device comprising:
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a metal layer being conductive; a first semiconductor layer of a first conductivity type containing a GaN crystal and receiving tensile stress in a (0001) plane; a second semiconductor layer of a second conductivity type, the second semiconductor layer being provided between the metal layer and the first semiconductor layer and containing a GaN crystal; a reflecting metal provided between the metal layer and the second semiconductor layer, the reflecting metal having direct connection with the second semiconductor layer; a light emitting layer provided between the first semiconductor layer and the second semiconductor layer, the light emitting layer containing a nitride semiconductor crystal; and a third semiconductor layer provided between the second semiconductor layer and the light emitting layer and relaxing tensile stress applied from the metal layer to the second semiconductor layer, the third semiconductor layer containing AlGaN crystal, the metal layer having a thermal expansion coefficient larger than a thermal expansion coefficient of the nitride semiconductor crystal, the first semiconductor layer having a first face and a second face, the first face facing the light emitting layer, the second face being opposite to the first face, and a light emitted from the light emitting layer being extracted through the second face. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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14. A semiconductor light emitting device comprising:
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a metal layer being conductive; a first semiconductor layer of a first conductivity type containing a GaN crystal and having tensile strain in a (0001) plane; a second semiconductor layer of a second conductivity type, the second semiconductor layer being provided between the metal layer and the first semiconductor layer and containing a GaN crystal; a reflecting metal provided between the metal layer and the second semiconductor layer, the reflecting metal having direct connection with the second semiconductor layer; a light emitting layer provided between the first semiconductor layer and the second semiconductor layer, the light emitting layer containing a nitride semiconductor crystal; and a third semiconductor layer provided between the second semiconductor layer and the light emitting layer, containing a AlGaN crystal, and having a lattice constant smaller than a lattice constant of the first semiconductor layer, the conductive metal layer having a thermal expansion coefficient larger than a thermal expansion coefficient of the nitride semiconductor crystal, the first semiconductor layer having a first face and a second face, the first face facing the light emitting layer, the second face being opposite to the first face, and a light emitted from the light emitting layer being extracted through the second face. - View Dependent Claims (15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26)
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Specification