Image sensor flicker detection

• US 9,473,706 B2
• Filed: 09/30/2014
• Issued: 10/18/2016
• Est. Priority Date: 12/09/2013
• Status: Active Grant

• Current Assignee: Apple Inc.
• Original Assignee: Apple Inc.
• Inventors: Malone, Michael R., Lee, Chiajen, Zeleznik, Christopher G.
• Primary Examiner(s): Tran, Sinh
• Assistant Examiner(s): Wang, Xi
• Application Number:
  US14/501,429
• Publication Number:
  US 20150163392A1
• Time in Patent Office: 749 Days
• Field of Search: 348/226.1, 348/227.1, 348/228.1, 348/230.1, 348/241
• US Class Current: 1/1
• CPC Class Codes: H04N 23/745 Detection of flicker frequency or suppression of flicker wherein the flicker is caused by illumination, e.g. due to fluorescent tube illumination or pulsed LED illumination
• CPC Class Codes: H04N 25/62 Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
• CPC Class Codes: H04N 25/702 SSIS architectures characterised by non-identical, non-equidistant or non-planar pixel layout
• CPC Class Codes: H04N 25/703 SSIS architectures incorporating pixels for producing signals other than image signals
• CPC Class Codes: H04N 25/75 Circuitry for providing, modifying or processing image signals from the pixel array

Abstract

An image sensor includes an imaging area and one or more flicker detection regions. The imaging area includes pixels that capture one or more images. Each flicker detection region includes pixels that are sampled multiple times while an image is being captured. The samples can be analyzed to detect flicker in the scene being imaged.

Claims

1. An image sensor, comprising:

an imaging area that includes a plurality of pixels;

one or more flicker detection regions each comprising one or more pixels; and

a first readout circuitry operatively connected to each flicker detection region, wherein the first readout circuitry comprises;

a first terminal of a transfer transistor operatively connected to each photodetector in a respective flicker detection region;

a second terminal of the transfer transistor operatively connected to a gate of a readout transistor;

a first terminal of a switch transistor operatively connected to the gate of the readout transistor;

a second terminal of the readout transistor and a second terminal of the switch transistor operatively connected to a voltage source; and

a variable capacitor operatively connected between the voltage source and the gate of the readout transistor;

wherein at least one of the one or more pixels in at least one flicker detection region is sampled multiple times while at least one pixel in the imaging area captures an image.

2. The image sensor as in claim 1, further comprising a second readout circuitry operatively connected to one or more pixels in the imaging area.

3. The image sensor as in claim 2, further comprising a processing device operatively connected to the first and the second readout circuitry.

4. The image sensor as in claim 1, wherein the first readout circuitry comprises:

a first terminal of a select transistor operatively connected to a first terminal of the readout transistor; and

a second terminal of the select transistor operatively connected to a column line.

5. An imaging system, comprising:

an imaging area that includes a plurality of pixels; and

one or more flicker detection regions each comprising one or more pixels;

a first readout circuitry operatively connected to each flicker detection region, wherein the first readout circuitry comprises;

a first terminal of a transfer transistor operatively connected to each photodetector in a respective flicker detection region;

a second terminal of the transfer transistor operatively connected to a gate of a readout transistor;

a first terminal of a switch transistor operatively connected to the gate of the readout transistor;

a second terminal of the readout transistor and a second terminal of the switch transistor operatively connected to a voltage source; and

a variable capacitor operatively connected between the voltage source and the gate of the readout transistor; and

a processor adapted to;

enable the one or more pixels in at least one flicker detection region to be sampled multiple times while the plurality of pixels in the imaging area capture an image; and

detect flicker in the image based on the samples read out of the one or more pixels in the at least one flicker detection region.

6. The imaging system as in claim 5, further comprising a second readout circuitry operatively connected to one or more pixels in the imaging area.

7. The imaging system as in claim 6, wherein the processor is operatively connected to the first readout circuitry.

8. The imaging system as in claim 6 , wherein the processor is operatively connected to the second readout circuitry.

9. A method for capturing an image in an image sensor, wherein the image sensor includes an imaging area comprising one or more pixels and one or more flicker detection regions each comprising one or more pixels, the method comprising:

capturing an image with at least one pixel in the imaging area;

substantially simultaneously accumulating charge in the one or more pixels in at least one flicker detection region;

performing multiple readout operations to obtain samples from the one or more pixels in the at least one flicker detection region while the at least one pixel in the imaging area captures the image, wherein each readout operation comprises averaging the samples by combining the samples on a common sense node or a common photo-current summing node operatively connected to the one or more pixels in the at least one flicker detection region; and

detecting flicker in the image by analyzing the samples.

10. The method as in claim 9, further comprising compensating for the flicker.

11. The method as in claim 10, wherein compensating for the flicker comprises adjusting an exposure time for capturing the image.

12. The method as in claim 9, further comprising prior to analyzing the samples, averaging the samples obtained in each readout operation.

13. The method as in claim 9, wherein analyzing the samples to detect flicker comprises performing a Fourier transform on the samples.

14. The method as in claim 9, wherein analyzing the samples to detect flicker comprises performing a correlation with the samples and a known flicker pattern to detect flicker.

15. The method as in claim 9, wherein analyzing the samples to detect flicker comprises measuring a distance between maxima and minima in the samples to detect flicker.

16. The method as in claim 9, further comprising determining a frequency of the detected flicker.