Techniques for matching spectra
First Claim
1. A method of controlling processing of a substrate, comprising:
- processing a substrate;
measuring a spectrum reflected from the substrate with a spectrographic monitoring system to generate a measured spectrum;
partitioning the measured spectrum into a plurality of partitions, each partition spanning a different range of wavelengths of the measured spectrum;
for each partition of the plurality of partitions of the measured spectrum, computing a partition value based on the measured spectrum within the partition to generate a plurality of partition values;
for each reference spectrum signature of a plurality of reference spectrum signatures, determining a membership function for each partition of the plurality of partitions of the measured spectrum based on the reference spectrum signature;
for each partition of the plurality of partitions of the measured spectrum, computing a membership value based on the membership function for the partition and the partition value for the partition to generate a plurality of groups of membership values with each group of the plurality of groups associated with a reference spectrum signature;
selecting a best matching reference spectrum signature from the plurality of reference spectra signatures based on the plurality of groups of membership values;
determining a characterizing value associated with the best matching reference spectrum signature; and
adjusting processing of the substrate or a subsequent substrate based on the characterizing value.
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Accused Products
Abstract
A method of controlling processing of a substrate includes measuring a spectrum reflected from the substrate, for each partition of a plurality of partitions of the measured spectrum, computing a partition value based on the measured spectrum within the partition to generate a plurality of partition values, for each reference spectrum signature of a plurality of reference spectrum signatures, determining a membership function for each partition, for each partition, computing a membership value based on the membership function for the partition and the partition value for the partition to generate a plurality of groups of membership values with each group of the plurality of groups associated with a reference spectrum signature, selecting a best matching reference spectrum signature from the plurality of reference spectra signatures based on the plurality of groups of membership values, and determining a characterizing value associated with the best matching reference spectrum signature.
11 Citations
21 Claims
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1. A method of controlling processing of a substrate, comprising:
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processing a substrate; measuring a spectrum reflected from the substrate with a spectrographic monitoring system to generate a measured spectrum; partitioning the measured spectrum into a plurality of partitions, each partition spanning a different range of wavelengths of the measured spectrum; for each partition of the plurality of partitions of the measured spectrum, computing a partition value based on the measured spectrum within the partition to generate a plurality of partition values; for each reference spectrum signature of a plurality of reference spectrum signatures, determining a membership function for each partition of the plurality of partitions of the measured spectrum based on the reference spectrum signature; for each partition of the plurality of partitions of the measured spectrum, computing a membership value based on the membership function for the partition and the partition value for the partition to generate a plurality of groups of membership values with each group of the plurality of groups associated with a reference spectrum signature; selecting a best matching reference spectrum signature from the plurality of reference spectra signatures based on the plurality of groups of membership values; determining a characterizing value associated with the best matching reference spectrum signature; and adjusting processing of the substrate or a subsequent substrate based on the characterizing value. - View Dependent Claims (2, 3, 4)
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5. A computer program product, tangibly embodied in a non-transitory computer readable medium, comprising instructions for causing a processor to:
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receive a measured spectrum of a substrate being processed from a spectrographic monitoring system; partition the measured spectrum into a plurality of partitions, each partition spanning a different range of wavelengths of the measured spectrum; for each partition of the plurality of partitions of the measured spectrum, compute a partition value based on the measured spectrum within the partition to generate a plurality of partition values; for each reference spectrum signature of a plurality of reference spectrum signatures, determine a membership function for each partition of the plurality of partitions of the measured spectrum based on the reference spectrum signature for each partition of the plurality of partitions of the measured spectrum, compute a membership value based on the membership function for the partition and the partition value for the partition to generate a plurality of groups of membership values with each group of the plurality of groups associated with a reference spectrum signature; select a best matching reference spectrum signature from the plurality of reference spectra signatures based on the plurality of groups of membership values; determine a characterizing value associated with the best matching reference spectrum signature; and adjust processing of the substrate or a subsequent substrate based on the characterizing value. - View Dependent Claims (6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21)
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Specification