Thermal management of tightly integrated semiconductor device, system and/or package
First Claim
Patent Images
1. A package comprising:
- a first die, wherein the first die is an integrated circuit (IC);
a second die adjacent to the first die, the second die capable of heating the first die;
a first plurality of through substrate vias (TSVs) configured to couple the first die to the second die;
a leakage sensor configured to measure a leakage current of the first die; and
a thermal management unit configured to couple to the leakage sensor, the thermal management unit configured to control a temperature of the first die based on the leakage current of the first die.
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Abstract
Some implementations provide a package that includes a first die and a second die adjacent to the first die. The second die is capable of heating the first die. The package also includes a leakage sensor configured to measure a leakage current of the first die. The package also includes a thermal management unit coupled to the leakage sensor. The thermal management unit configured to control a temperature of the first die based on the leakage current of the first die.
32 Citations
51 Claims
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1. A package comprising:
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a first die, wherein the first die is an integrated circuit (IC); a second die adjacent to the first die, the second die capable of heating the first die; a first plurality of through substrate vias (TSVs) configured to couple the first die to the second die; a leakage sensor configured to measure a leakage current of the first die; and a thermal management unit configured to couple to the leakage sensor, the thermal management unit configured to control a temperature of the first die based on the leakage current of the first die. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
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17. An apparatus comprising:
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a first die, wherein the first die is an integrated circuit (IC); a second die adjacent to the first die, the second die capable of heating the first die; a first plurality of through substrate vias (TSVs) configured to couple the first die to the second die; means for measuring a leakage current of the first die; and means for controlling a temperature of the first die based on the leakage current of the first die. - View Dependent Claims (18, 19, 20, 21, 22, 23, 24, 25, 26)
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27. A method for manufacturing a package encapsulating several dice, the method comprising:
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positioning a first die on a packaging substrate, wherein the first die is an integrated circuit (IC); positioning a second die adjacent to the first die, the second die capable of heating the first die; positioning a first plurality of through substrate vias (TSVs) between the first die and the second die, wherein the first plurality of TSVs is configured to couple the first die to the second die; positioning a leakage sensor within the package, the leakage sensor configured to measure a leakage current of the first die; and positioning a thermal management unit within the package, the thermal management unit configured to couple to the leakage sensor, the thermal management unit configured to control a temperature of the first die based on the leakage current of the first die. - View Dependent Claims (28, 29, 30, 31, 32, 33, 34, 35, 36)
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37. A package comprising:
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a first die on a substrate, wherein the first die is an integrated circuit (IC); a second die configured to couple to the first die through a plurality of through substrate vias (TSVs), the second die capable of heating the first die via the plurality of TSVs; a leakage sensor configured to measure a leakage current of the first die; and a thermal management unit configured to couple to the leakage sensor, the thermal management unit configured to control a temperature of the first die based on the leakage current of the first die. - View Dependent Claims (38, 39, 40)
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41. A method for manufacturing a package, the method comprising:
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positioning a first die on a packaging substrate, wherein the first die is an integrated circuit (IC); positioning a second die adjacent to the first die, positioning a plurality of through substrate vias (TSVs) between the first die and the second die, the plurality of TSVs configured to couple the first die to the second die, wherein the second die is capable of heating the first die via the plurality of TSVs; positioning a leakage sensor within the package, the leakage sensor configured to measure a leakage current of the first die; positioning a thermal management unit within the package, the thermal management unit configured to couple to the leakage sensor, the thermal management unit configured to control a temperature of the first die based on the leakage current of the first die; and positioning a second plurality of through substrate vias (TSVs) between the first die and the packaging substrate, wherein the second plurality of TSVs is configured to couple the first die to the packaging substrate.
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42. A method for managing temperature in a package comprising a first die, a second die, a first plurality of through substrate vias (TSVs), and a second plurality of through substrate vias (TSVs), wherein the first plurality of TSVs is configured to couple the first die to a package substrate, comprising:
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using a leakage sensor within the package for measuring a leakage current of a first die, the first die configured to couple to the second die via the second plurality of through substrate vias (TSVs), wherein the first die is an integrated circuit (IC); and controlling the temperature of the first die by reducing activity of the second die based on the measured leakage current of the first die. - View Dependent Claims (43)
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44. A non-transitory computer readable storage medium comprising one or more instructions for managing temperature in a package comprising a first die and a second die, and a plurality of through substrate vias (TSVs), which when executed by at least one processor, causes the at least one processor to:
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measure a leakage current of a first die, the first die configured to couple to the second die via the plurality of through substrate vias (TSVs), wherein the first die is an integrated circuit (IC); and control the temperature of the first die by reducing activity of the second die based on the measured leakage current of the first die. - View Dependent Claims (45)
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46. A method for managing temperature in a package comprising a first die and a second die, and a plurality of through substrate vias (TSVs) configured to couple the first die to the second die, comprising:
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using a leakage sensor within the package for measuring a leakage current of a first die, wherein the first die is an integrated circuit (IC); and controlling the temperature of the first die by reducing activity of the second die based on the leakage current of the first die. - View Dependent Claims (47, 48)
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49. A non-transitory computer readable storage medium comprising one or more instructions for managing temperature in a package comprising a first die and a second die, and a plurality of through substrate vias (TSVs) configured to couple the first die to the second die, which when executed by at least one processor, causes the at least one processor to:
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use a leakage sensor within the package to measure a leakage current of a first die, wherein the first die is an integrated circuit (IC); and control the temperature of the first die by reducing activity of the second die based on the leakage current of the first die. - View Dependent Claims (50, 51)
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Specification