Imaging structure emitter calibration

• US 9,578,318 B2
• Filed: 03/14/2012
• Issued: 02/21/2017
• Est. Priority Date: 03/14/2012
• Status: Active Grant

• Current Assignee: Microsoft Technology Licensing LLC (Microsoft Corporation)
• Original Assignee: Microsoft Technology Licensing LLC (Microsoft Corporation)
• Inventors: Fleck, Rod G., Bohn, David D.
• Primary Examiner(s): DIEP, NHON THANH
• Application Number:
  US13/420,388
• Publication Number:
  US 20130242056A1
• Time in Patent Office: 1,805 Days
• US Class Current: 1/1
• CPC Class Codes: G02B 2027/0132 comprising binocular systems
• CPC Class Codes: G02B 2027/014 comprising information/image processing systems
• CPC Class Codes: G02B 2027/0178 Eyeglass type eyeglass details G02C
• CPC Class Codes: G02B 26/0833 the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD G02B26/0825 takes precedence; micromechanical devices in general B81B
• CPC Class Codes: G02B 27/0093 with means for monitoring data relating to the user, e.g. head-tracking, eye-tracking
• CPC Class Codes: G02B 27/0172 characterised by optical features
• CPC Class Codes: H04N 13/296 Synchronisation thereof; Control thereof
• CPC Class Codes: H04N 13/344 with head-mounted left-right displays
• CPC Class Codes: H04N 13/363 using image projection screens volumetric display H04N13/388
• CPC Class Codes: H04N 13/383 for tracking with gaze detection, i.e. detecting the lines of sight of the viewer's eyes

Abstract

In embodiments of imaging structure emitter calibration, an imaging unit includes an emitter structure that direct emits light, and optics direct the light along a light path in the imaging unit to illuminate a projection surface. A reflective panel reflects a portion of the light to illuminate a light sensor. An imaging application receives the sensor data from the light sensor, where the sensor data corresponds to emitted light output from the emitter structure. The imaging application can then initiate a calibration input to the emitter structure to adjust the emitted light output from the emitter structure.

Claims

1. An imaging unit, comprising:

an emitter structure configured to direct emit light;

optics configured to direct the light along a light path in the imaging unit;

a projection surface that the optics direct the light along the light path to illuminate, the projection surface being an electrically alterable mirror configured to scan in at least one dimension to reflect the light through an imaging optic that directs the light into a display optic;

a reflective panel configured to reflect a portion of the light directed by the projection surface to illuminate a light sensor, the reflective panel positioned proximal to the imaging optic allowing the portion of the light to be reflected at a beginning position or an end position of the scan in the at least one direction of the projection surface; and

an imaging application configured to receive sensor data from the light sensor, the sensor data corresponding to emitted light output from the emitter structure, and the imaging application further configured to initiate a calibration input to the emitter structure to adjust the emitted light output from the emitter structure.

2. An imaging unit as recited in claim 1, wherein the emitter structure comprises individual embedded light sources configured to direct emit the light, and wherein the calibration input adjusts the emitted light output from an individual embedded light source of the emitter structure.

3. An imaging unit as recited in claim 2, wherein the imaging application is configured to compute a correction value for each of the individual embedded light sources of the emitter structure over a time duration.

4. An imaging unit as recited in claim 2, wherein the individual embedded light sources are configured to cycle to direct emit the light one at a time, and wherein the imaging application is configured to initiate the calibration input for each individual embedded light source.

5. An imaging unit as recited in claim 1, wherein the calibration input to the emitter structure corrects for operational conditions that affect the emitted light output from the emitter structure.

6. An imaging unit as recited in claim 1, wherein the light sensor is positioned proximate the projection surface in the imaging unit.

7. An imaging unit as recited in claim 1, wherein the light sensor comprises a linear array of light detectors, and wherein the imaging application is configured to receive the sensor data from the linear array of light detectors.

8. An imaging structure as recited in claim 1, wherein the emitter structure comprises a one-dimensional or two-dimensional array of individual embedded light sources formed in inorganic material as one of lasers or LEDs to direct emit the light.

9. A method, comprising:

emitting light from an emitter structure in an imaging unit;

directing the light along a light path with optics to illuminate a projection surface in the imaging unit, the projection surface being an electrically alterable mirror configured to scan in at least one dimension to reflect the light through an imaging optic that directs the light into a display optic;

reflecting a portion of the light directed by the projection surface to illuminate a light sensor using a reflective panel positioned proximal to the imaging optic allowing the portion of the light to be reflected at a beginning position or an end position of the scan in the at least one direction of the projection surface;

receiving sensor data from the light sensor, the sensor data corresponding to emitted light output from the emitter structure; and

initiating a calibration input to the emitter structure to adjust the emitted light output from the emitter structure.

10. A method as recited in claim 9, further comprising adjusting the emitted light output of each individual embedded light source of the emitter structure.

11. A method as recited in claim 10, further comprising computing a correction value for each of the individual embedded light sources of the emitter structure over a time duration.

12. A method as recited in claim 10, wherein the individual embedded light sources of the emitter structure cycle to direct emit the light one at a time, and wherein the calibration input is said initiated for each individual embedded light source.

13. A method as recited in claim 9, wherein the calibration input corrects for operational conditions that affect the emitted light output from the emitter structure.

14. A method as recited in claim 9, wherein the light sensor comprises a linear array of light detectors, and wherein the sensor data is said received from the linear array of light detectors.

15. A method, comprising:

generating an augmented reality image with imaging units, each of the imaging units comprising;

optics directing light along a light path to illuminate a projection surface that is an electrically alterable mirror configured to scan in at least one dimension to reflect the light through an imaging optic that directs the light into a display optic;

a reflective panel reflecting a portion of the light directed by the projection surface to illuminate a light sensor that generates sensor data corresponding to emitted light output from an emitter structure, the reflective panel positioned proximal to the imaging optic allowing the portion of the light to be reflected at a beginning position or an end position of the scan in the at least one direction of the projection surface; and

calibrating the emitter structure to adjust the emitted light output from the emitter structure.

16. A method as recited in claim 15, wherein the light sensor comprises a linear array of light detectors.

17. A method as recited in claim 15, further comprising:

receiving the sensor data from each light sensor of the respective imaging units; and

generating a calibration input to the emitter structure in each of the respective imaging units to adjust the emitted light output from the emitter structures.

18. A method as recited in claim 17, wherein the calibration input to the emitter structure corrects for operational conditions that affect the emitted light output from the emitter structure.

19. A method as recited in claim 17, wherein the emitter structure comprises individual embedded light sources configured to direct emit the light, and wherein the calibration input adjusts the emitted light output from an individual embedded light source of the emitter structure.

20. A method as recited in claim 19, further comprising:

computing a correction value for each of the individual embedded light sources of the emitter structure over a time duration.