Amorphous silicon photoelectric device and fabricating method thereof
First Claim
1. A fabricating method of an amorphous-silicon photoelectric device, comprising steps of:
- performing a first patterning process so that patterns of a gate-electrode layer, a photosensor with a photodiode structure and a contact layer located below the photosensor are formed on a substrate, the photosensor being completely located above the contact layer, the contact layer being partially covered by the photosensor, the patterns of the gate-electrode layer including a gate-electrode, the contact layer and the gate-electrode being provided in a same layer and made of a same material;
performing a second patterning process, so that an insulating layer, a second semiconductor layer, and patterns of a source/drain-electrode layer are sequentially formed on a resultant substrate of the first patterning process; and
forming a first passivation layer on a resultant substrate of the second patterning process, and performing a third patterning process so that a first via-hole is formed in the first passivation layer to expose partial regions of the contact layer, the photosensor, and the source/drain-electrode layer.
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Abstract
An amorphous-silicon photoelectric device and a fabricating method thereof are disclosed. The amorphous-silicon photoelectric device includes: a substrate; a thin-film transistor and a photosensor with the photodiode structure, which are provided at different positions on the substrate; and a contact layer; in which the contact layer is located below the photosensor, and the contact layer is partially covered by the photosensor, moreover, the contact layer and the gate-electrode layer in the thin-film transistor are provided in a same layer and of a same material. According to the technical solutions of the present disclosure, the fabricating procedure of an a-Si photoelectric device can be simplified, thereby improving the fabrication efficiency and reducing costs.
5 Citations
12 Claims
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1. A fabricating method of an amorphous-silicon photoelectric device, comprising steps of:
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performing a first patterning process so that patterns of a gate-electrode layer, a photosensor with a photodiode structure and a contact layer located below the photosensor are formed on a substrate, the photosensor being completely located above the contact layer, the contact layer being partially covered by the photosensor, the patterns of the gate-electrode layer including a gate-electrode, the contact layer and the gate-electrode being provided in a same layer and made of a same material; performing a second patterning process, so that an insulating layer, a second semiconductor layer, and patterns of a source/drain-electrode layer are sequentially formed on a resultant substrate of the first patterning process; and forming a first passivation layer on a resultant substrate of the second patterning process, and performing a third patterning process so that a first via-hole is formed in the first passivation layer to expose partial regions of the contact layer, the photosensor, and the source/drain-electrode layer. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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Specification