Contact sensor

• US 9,766,742 B2
• Filed: 12/05/2013
• Issued: 09/19/2017
• Est. Priority Date: 12/05/2012
• Status: Expired due to Fees

• Current Assignee: R&D Core Limited
• Original Assignee: R&D Core Limited
• Inventors: Papakostas, Thomas
• Primary Examiner(s): Lee, Nicholas
• Assistant Examiner(s): Taylor, Jr., Duane N
• Application Number:
  US14/649,789
• Publication Number:
  US 20150309651A1
• Time in Patent Office: 1,384 Days
• Field of Search: None
• CPC Class Codes: G06F 2203/04103 Manufacturing, i.e. details related to manufacturing processes specially suited for touch sensitive devices
• CPC Class Codes: G06F 3/04144 using an array of force sensing means position sensing using the local deformation of sensor cells G06F3/0447
• CPC Class Codes: G06F 3/04166 Details of scanning methods, e.g. sampling time, grouping of sub areas or time sharing with display driving Synchronisation with the driving of the display or the backlighting unit to avoid interferences generated internally G06F3/04184
• CPC Class Codes: G06F 3/045 using resistive elements, e.g. a single continuous surface or two parallel surfaces put in contact
• CPC Class Codes: G06F 3/047 using sets of wires, e.g. crossed wires

Abstract

A contact sensor apparatus comprises: a first insulative layer (100); a second insulative layer (200); a first resistor strip (101) on the first insulative layer; a second resistor strip (201) on the second insulative layer; a plurality of first conductive traces (102) provided on the first insulative layer and electrically connected to the first resistor strip; and a plurality of second conductive traces (202) provided on the second insulative layer and electrically connected to the second resistor strip. The first insulative layer and second insulative layer face each other such that the plurality of first conductive traces face the plurality of second conductive traces with each of the first conductive traces extending across the plurality of second conductive traces and each of the second conductive traces extending across the plurality of first conductive traces thereby forming an array of points of intersection of the first and second conductive traces. The first insulative layer and second insulative layer are spaced apart such that there is no electrical contact between the plurality of first and second conductive traces when a contact is not applied to the contact sensor. When a contact is applied there is an electrical contact between at least one of each of the plurality of first and second conductive traces in a region of the contact.

Claims

1. A contact sensor apparatus, the sensor comprising:

a first insulative layer;

a second insulative layer;

a first resistor strip on the first insulative layer;

a second resistor strip on the second insulative layer;

a plurality of first conductive traces provided on the first insulative layer and electrically connected to the first resistor strip; and

a plurality of second conductive traces provided on the second insulative layer and electrically connected to the second resistor strip;

wherein the first insulative layer and second insulative layer face each other such that the plurality of first conductive traces face the plurality of second conductive traces with each of the first conductive traces extending across the plurality of second conductive traces and each of the second conductive traces extending across the plurality of first conductive traces thereby forming an array of points of intersection of the first and second conductive traces,

wherein the first insulative layer and second insulative layer are spaced apart such that there is no electrical contact between the plurality of first and second conductive traces when a contact is not applied to the contact sensor,

wherein when a contact is applied there is an electrical contact between at least one of each of the plurality of first and second conductive traces in a region of the contact, and

wherein when the contact is applied to the apparatus, the apparatus is operable to determine the dimensions of the contact as projected to the first and second resistor strips by measuring an electrical quantity across the first and second resistor strips.

2. An apparatus as claimed in claim 1, wherein the apparatus is further operable to compare the electrical quantity to the same electrical quantity measured when no contact is applied.

3. An apparatus as claimed in claim 1, wherein the apparatus is configured to determine a force or a change in force applied by the contact;

preferably wherein the apparatus is configured to use the determination of the dimensions of the contact to determine a force or a change in force applied by the contact, or wherein the surfaces of the conductive traces are covered by a force sensing resistor element such that a contact resistance between the conductive traces at each point of intersection is inversely proportional to the contact force.

4. An apparatus as claimed in claim 1, wherein the apparatus is operable to determine a location of the contact along each dimension, wherein the apparatus is configured to:

a) apply a constant current across a resistor strip;

b) connect a high impedance voltage measuring circuit to the other resistor strip or corresponding conductive trace pattern; and

c) measure the voltage drop over a part of the resistor strip extending from an end of the resistor strip to an edge of the contact to thereby determine the length of this part of the strip.

5. An apparatus as claimed in claim 1, wherein the apparatus is operable to determine a location of the contact along each dimension, the apparatus comprising:

a constant voltage source; and

a known-value resistor provided between the constant voltage source and the resistor strip;

wherein the apparatus is configured to;

a) apply a constant voltage across the known-value resistor and the resistor strip;

b) measure the voltage drop across the known-value resistor;

c) determine the current through the known-value resistor and resistor strip from the measured voltage drop and known resistance of the known-value resistor;

d) connect a high impedance voltage measuring circuit to the other resistor strip or corresponding conductive trace pattern; and

e) measure the voltage drop over a part of the resistor strip extending from an end of the resistor strip to an edge of the contact to thereby determine the length of this part of the strip.

6. An apparatus as claimed in any preceding claim 1, wherein the first and second resistor strips comprise a conductive connector connected to an electrical meter operable to make an electrical measurement to establish a size and/or a location of a contact.

7. An apparatus as claimed in claim 6, wherein each of the first and second resistor strips comprises a first and second end, and each of the first and second ends is connected by the conductive connector to the electrical meter.

8. An apparatus as claimed in claim 6, wherein each of the first and second resistor strips comprises a first and second end, and each of the first and second ends is connected by the conductive connector to a voltage source, a current source or ground or floating.

9. An apparatus as claimed in any preceding claim 1, wherein the resistance of each of the plurality of first and second conductive traces is less than the resistance of each step of the resistor strip across the spacing between adjacent conductive traces, and preferably wherein the resistance of each of the plurality of first and second conductive traces is at least two times less than the resistance of each step of the resistor strip across the spacing between adjacent conductive traces.

10. An apparatus as claimed in any preceding claim 1, wherein the resistance of each of the plurality of first and second conductive traces is at least five times less than the resistance of each step of the resistor strip across the spacing between adjacent conductive traces.

11. An apparatus as claimed in any preceding claim 1, wherein the plurality of first conductive traces are spaced regularly along the first resistor strip by a first spacing, and the plurality of second conductive traces are spaced regularly along the second resistor strip by a second spacing.

12. An apparatus as claimed in any preceding claim 1, wherein the first and second resistor strips have equal resistance per unit length.

13. An apparatus as claimed in any preceding claim 1, wherein the first and second conductive traces cross at an angle of at least 10°

, preferably wherein the angle is 90°

.

14. An apparatus as claimed in any preceding claim 1, wherein the first insulative layer and second insulative layer are resiliently spaced apart.

15. An apparatus as claimed in claim 14, wherein the first insulative layer and second insulative layer are resiliently spaced apart by a spacing structure between the first and second insulative layers.

16. An apparatus as claimed in claim 15, wherein the spacing structure is a series of electrically insulative dots, or an electrically insulative grid, or wherein the spacing structure is a resistive layer.

17. An apparatus as claimed in any preceding claim 1, wherein the contact sensor is flexible.

18. A method for determining a size of a contact applied to an apparatus as claimed in claim 1, comprising, when the contact is applied to the apparatus, determining the dimensions of the contact as projected to the first and second resistor strips by measuring an electrical quantity across the first and second resistor strips.

20. The apparatus as claimed in claim 1, wherein the apparatus is operable to determine the location of two contacts.

19. A method of manufacturing a contact sensor apparatus, the method comprising:

providing a first insulative layer;

providing a second insulative layer;

providing a first resistor strip on the first insulative layer;

providing a second resistor strip on the second insulative layer;

providing a plurality of first conductive traces on the first insulative layer to be electrically connected to the first resistor strip; and

providing a plurality of second conductive traces on the second insulative layer to be electrically connected to the second resistor strip,

wherein the first insulative layer and second insulative layer are arranged to face each other such that the plurality of first conductive traces face the plurality of second conductive traces with each of the first conductive traces extending across the plurality of second conductive traces and each of the second conductive traces extending across the plurality of first conductive traces, thereby forming an array of points of intersection of the first and second conductive traces,

wherein the first insulative layer and second insulative layer are spaced apart such that there is no electrical contact between the plurality of first and second conductive traces when a contact is not applied to the contact sensor,

wherein when a contact is applied there is an electrical contact between at least one of each of the plurality of first and second conductive traces in a region of the contact, and

wherein when the contact is applied to the apparatus, the apparatus determines the dimensions of the contact as projected to the first and second resistor strips by measuring an electrical quantity across the first and second resistor strips.