Method for testing state settings of chip set

Method for testing state settings of chip set

  • CN 100,334,702 C
  • Filed: 07/31/2002
  • Issued: 08/29/2007
  • Est. Priority Date: 07/31/2002
  • Status: Active Grant
First Claim
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1. the detection method of a state settings of chip set is characterized in that, it consists predominantly of the following step:

  • One motherboard that includes a wafer to be detected is provided;

    One bios program that includes a configuration trace routine is provided;

    Start power supply;

    The selftest of starting shooting;

    Be written into described bios program;

    AndCarrying out the configuration and setting of this wafer in configuration space detects;

    Wherein, the configuration trace routine that described bios program comprised includes the following step;

    One test data is provided;

    The one expected results data corresponding to this test data is provided;

    Import this test data;

    Start according to the buffer of this test data a correspondence in this wafer set state space;

    Obtain the data as a result that is produced after this wafer operation;

    AndThis data as a result that obtains and expected results data are compared.

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