Micrometric direct-write methods for patterning conductive material and applications to flat panel display repair

Micrometric direct-write methods for patterning conductive material and applications to flat panel display repair

  • CN 101,002,513 A
  • Filed: 02/25/2005
  • Published: 07/18/2007
  • Est. Priority Date: 02/25/2004
  • Status: Active Application
First Claim
Patent Images

1. method comprises:

  • Cantilever with cantilever end is provided, and wherein, this cantilever is no needle point cantilever;

    The ink that is arranged on this cantilever end is provided;

    Substrate surface is provided;

    Move this cantilever end or move this substrate surface, make ink be sent to this substrate surface by this cantilever end.

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