Method for establishing contour baseline in two-dimension surface roughness assessment

Method for establishing contour baseline in two-dimension surface roughness assessment

  • CN 101,082,484 A
  • Filed: 06/25/2007
  • Published: 12/05/2007
  • Est. Priority Date: 06/25/2007
  • Status: Active Application
First Claim
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1. , set up the method for profile datum line in a kind of two-dimensional surface roughness assessment, it is characterized in that step is as follows:

  • (1) gathers or from data file, is written into surface profile data, according to waiting that evaluating surperficial actual state chooses sample length l and evaluation length l n(2) according to selected sample length l and evaluation length l n, the intercepting outline data is;

    x (0)

    {x (0)(1),

    x (0)(2),





    x (0)(N)} (1) Wherein, N is the number of original contour sampled data in the evaluation length, and establishing the interior sampled data number of a sample length is n, with sequence x (0)In from x (0)(m+1) Kai Shi continuous n item is as the m of original contour sampled data sequence constantly, that is, x m(0)

    {x m(0)(1),

    x m(0)(2),





    x m(0)(n)}=

    {x (0)(m+1),

    x (0)(m+2),





    x (0)(m+n)} (2) Wherein, m=0,1,2 ..., N-n;

    (3) utilize the grey roll modeling, to the m moment sequence x of original contour sampled data m(0)Carry out grey modeling, obtain the gray model value sequence;

    x^m(0)(k+1)=x^m(1)(k+1)-x^m(1)(k);

    (3) (4) sequence x is obtained in the gray model value sequence set that is obtained by step (3) m(0)Pairing gray model curve;

    (5) all model curves that step (4) is obtained comprehensively obtain a smooth contour curve, and this curve is the profile datum line of roughness assessment.

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