Fluorescence x-ray spectroscope and program used therefore

Fluorescence x-ray spectroscope and program used therefore

  • CN 101,151,524 A
  • Filed: 12/08/2005
  • Published: 03/26/2008
  • Est. Priority Date: 04/06/2005
  • Status: Active Application
First Claim
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1. fluorescent x-ray analyzer, it comprises:

  • X-ray source to sample irradiation primary X-ray;

    Testing agency, this testing agency measure from the intensity of the secondary x rays of this sample generation;

    Calculation mechanism, this calculation mechanism is according to the component of supposition, the theoretical strength of the secondary x rays that calculating each element from sample produces, according to this theoretical strength and by the mensuration intensity conversion that above-mentioned testing agency measures is the consistent mode of conversion mensuration intensity of theoretical strength value, the component of the above-mentioned supposition of successive approximation ground corrected Calculation, the component of calculating sample;

    Aforementioned calculation mechanism when calculating above-mentioned theory intensity, with the intensity of the size of sample and the primary X-ray of each position that shines specimen surface and incident angle as parameter, at the theoretical strength of each light path analog computation secondary x rays.

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