Fluorescence x-ray spectroscope and program used therefore

Fluorescence x-ray spectroscope and program used therefore

  • CN 101,151,524 B
  • Filed: 12/08/2005
  • Issued: 06/05/2013
  • Est. Priority Date: 04/06/2005
  • Status: Active Grant
First Claim
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1. fluorescent x-ray analyzer, it comprises:

  • Set the device of initial value;

    Be that the theoretical strength value is measured the device of intensity as converting with measuring intensity conversion;

    According to initial value, with the intensity of the size of sample and the primary X-ray of each position that shines specimen surface and incident angle as parameter, determine occurrence positions, the direction of primary X-ray by random number, for making primary X-ray advance to the device of theoretical strength of each light path analog computation secondary x rays of specimen surface;

    The concentration of element, the average atomic number of non-mensuration element are respectively measured in the value change according to the rules respectively, calculate the device of theoretical strength after changing;

    According to difierence equation, the device that each average atomic number of measuring the concentration of element, non-mensuration element is upgraded;

    According to theoretical strength with convert to measure the consistent mode of intensity, successive approximation ground is revised and the device of the average atomic number of the non-mensuration element of the concentration of the mensuration element of calculation assumption and supposition;

    Device with measurement result output.

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