Generation and storage of column offsets for an image sensor

Generation and storage of column offsets for an image sensor

  • CN 101,160,955 B
  • Filed: 04/14/2006
  • Issued: 03/27/2013
  • Est. Priority Date: 04/14/2005
  • Status: Active Grant
First Claim
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1. column circuits that is used for imaging device, it comprises:

  • A plurality of row sense wires;

    A plurality of signal chains, each signal chains is associated with the N in described a plurality of row sense wires is individual, and wherein N is the integer greater than 1, and each signal chains comprises;

    Multiplexer;

    Analog processor circuit;

    Analog gain circuit;

    Analog-digital converter;

    Demultiplexer;

    At least one memory, the every signal chains of described at least one memory comprise N separately memory storage area, and each in the described memory storage area is used for the deviant that storage is associated with the corresponding one of described a plurality of row sense wires;

    AndControl circuit, it is used for calculating each deviant that is stored in described memory area, and the described digital pixel readout of processing described deviant and being processed by described signal chains, wherein said control circuit comprises logical circuit, the maximum one that described logical circuit is used for described deviant is calculated as the described digital pixel value that is produced by described a plurality of row read lines with by each poor between the digital pixel value of row sense wire generation separately.

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