Substrate detecting device and substrate detecting method

Substrate detecting device and substrate detecting method

  • CN 101,191,811 A
  • Filed: 11/29/2007
  • Published: 06/04/2008
  • Est. Priority Date: 11/30/2006
  • Status: Active Grant
First Claim
Patent Images

1. base board checking device, it is checked and uses signal by making between the checkpoint of setting on a plurality of wiring figures on the inspection substrate to produce potential difference (PD) and to take out from described checkpoint, check the electrical characteristics between described wiring figure, it is characterized in that this base board checking device has:

  • The a plurality of probes that contact with the conducting of described checkpoint;

    Make the efferent that produces potential difference (PD) between described checkpoint via described probe;

    AndWhen giving described potential difference (PD) via the test section of described probe in detecting from the signal of described checkpoint,Described efferent makes between described checkpoint and to produce following potential difference (PD), that is, make doubtful short circuit portion'"'"'s conducting of doubtful short circuit between the described wiring figure of adjacency but can not be flow through the electric current scaling loss of this doubtful short circuit portion.

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