Apparatus for electromagnetically measuring a wall thickness

Apparatus for electromagnetically measuring a wall thickness

  • CN 101,223,413 A
  • Filed: 06/21/2006
  • Published: 07/16/2008
  • Est. Priority Date: 07/12/2005
  • Status: Active Application
First Claim
Patent Images

1. measurement mechanism has transmitting element (10,42), is used to produce measurement field (12) electromagnetism, that penetrate wallboard (18);

  • Have receiving element (14), be used to survey at least a portion of measurement field (12);

    And has an analysis and processing unit (16), be used for the signal (20) that is detected by receiving element (14) is carried out analyzing and processing, it is characterized in that analysis and processing unit (16) is set for obtains measurement field (12) at least one characteristic parameter (t along the position relation of wallboard (18) 1-t 3, t 12, t 13), and according to this characteristic parameter (t 1-t 3, t 12, t 13) determine the wall thickness (D) of wallboard (18).

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