Method and system for parallel testing

Method and system for parallel testing

  • CN 101,686,480 A
  • Filed: 09/26/2008
  • Published: 03/31/2010
  • Est. Priority Date: 09/26/2008
  • Status: Active Application
First Claim
Patent Images

1. , a kind of method of concurrent testing is characterized in that, this method comprises:

  • adopt the concurrent testing mechanism of time division duplex, up receiver index, descending indicator transmitter and at least two class indexs in its functional attributes are carried out concurrent testing.

View all claims
    ×
    ×

    Thank you for your feedback

    ×
    ×