Electronic apparatus testing device and electronic apparatus testing method

Electronic apparatus testing device and electronic apparatus testing method

  • CN 101,688,891 A
  • Filed: 06/03/2008
  • Published: 03/31/2010
  • Est. Priority Date: 06/03/2008
  • Status: Active Application
First Claim
Patent Images

1. electronic apparatus testing device comprises:

  • The chamber that e-machine is tested;

    Passage, the described chamber of this channel connection outside and inner, and have at least that shielding comes from outside electromagnetic electromagnetic wave screen unit when testing;

    WithThe conveyance unit has the conveying unit of the described e-machine of conveyance, and this electronic apparatus testing device is characterised in that;

    Described conveying unit constitutes and can described e-machine can be moved into described chamber, and described e-machine can be taken out of from described chamber by the inside of described passage.

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