Analyzing tool, and its manufacturing method

Analyzing tool, and its manufacturing method

  • CN 101,842,697 A
  • Filed: 10/31/2008
  • Published: 09/22/2010
  • Est. Priority Date: 10/31/2007
  • Status: Active Application
First Claim
Patent Images

1. analysis tool comprises:

  • Substrate;

    First electrode, it is formed on the aforesaid substrate, and comprises working electrode;

    Second electrode, it is formed on the aforesaid substrate, and comprises electrode;

    WithFirst limiting element, it is used to limit the contact area that contacts with sample on the above-mentioned working electrode,Wherein,Have second limiting element, this second limiting element is used for limiting above-mentioned working electrode and above-mentioned to the useful area that electronics is given and accepted that carries out at least one side of electrode.

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