Sub-diffraction limit image resolution in three dimensions

Sub-diffraction limit image resolution in three dimensions

  • CN 101,918,816 A
  • Filed: 12/19/2008
  • Published: 12/15/2010
  • Est. Priority Date: 12/21/2007
  • Status: Active Application
First Claim
Patent Images

1. method comprises:

  • First entity and second entity that separate with less than the distance of about 1000nm are provided;

    Determine light by described first entity emission;

    Determine light by described second entity emission;

    AndUse is by the light of described first entity emission and determined x, y and the z position of described first entity and described second entity by the light of described second entity emission.

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